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Characteristic-Impedance Measurement Error on Lossy Substrates

Published

Author(s)

Dylan Williams, Uwe Arz, Hartmut Grabinski

Abstract

This paper examines error in the characteristic impedance measured by the calibration comparison method.
Citation
IEEE Microwave and Wireless Components Letters
Volume
11
Issue
7

Keywords

characteristic impedance, lossy substrate, microstrip, parasitic pad capacitance, silicon, transmission line

Citation

Williams, D. , Arz, U. and Grabinski, H. (2001), Characteristic-Impedance Measurement Error on Lossy Substrates, IEEE Microwave and Wireless Components Letters, [online], https://doi.org/10.1109/7260.933777, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=13906 (Accessed March 5, 2024)
Created June 30, 2001, Updated October 12, 2021