Compensation for Geometrical Variations in Coplanar Waveguide Probe-Tip Calibration
Dave K. Walker, Dylan F. Williams
We show how coplanar-waveguide probe-tip scattering parameter calibrations performed in one coplanar waveguide conductor geometry may be adjusted for measurement in another. The method models the difference between the two probe-tip-to-coplanar-waveguide transitions as a change in shunt capacitance and applies previously developed techniques for its determination and compensation. Comparison to accurate multiline Thro-Reflect-Line calibrations verifies the accuracy of the method. Differences in both conductor geometry and substrate permittivity are considered in the comparison. The method requires only a single, compact open stub or thru line fabricated on the measurement wafer.
and Williams, D.
Compensation for Geometrical Variations in Coplanar Waveguide Probe-Tip Calibration, IEEE Microwave and Guided Wave Letters, [online], https://doi.org/10.1109/75.563631
(Accessed June 6, 2023)