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Measuring the Invasiveness of High-Impedance Probes

Published

Author(s)

Uwe Arz, Pavel Kabos, Dylan Williams

Abstract

We use on-wafer measurements to characterize the invasiveness of high-impedance probes over a broad frequency range. We show that a two-port representation characterizing the invasiveness of the probe can also be determined from a calculation of the probe's load impedance, which is derived from a separate characterizatrion of the high-impednace probe.
Proceedings Title
Proc. IEEE Workshop on Signal Propagation on Interconnects
Conference Dates
May 11-14, 2003
Conference Location
Siena, 1, IT
Conference Title
7th IEEE Workshop on Signal Propagation on Interconnects

Keywords

calibration, high-impedance probe, invasiveness, loading, measurement, microwave

Citation

Arz, U. , Kabos, P. and Williams, D. (2003), Measuring the Invasiveness of High-Impedance Probes, Proc. IEEE Workshop on Signal Propagation on Interconnects, Siena, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31316 (Accessed February 21, 2024)
Created May 13, 2003, Updated October 12, 2021