Arz, U.
, Kabos, P.
and Williams, D.
(2003),
Measuring the Invasiveness of High-Impedance Probes, Proc. IEEE Workshop on Signal Propagation on Interconnects, Siena, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31316
(Accessed May 10, 2024)
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Measuring the Invasiveness of High-Impedance Probes
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Author(s)
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Abstract
We use on-wafer measurements to characterize the invasiveness of high-impedance probes over a broad frequency range. We show that a two-port representation characterizing the invasiveness of the probe can also be determined from a calculation of the probe's load impedance, which is derived from a separate characterizatrion of the high-impednace probe.Proceedings Title
Proc. IEEE Workshop on Signal Propagation on Interconnects
Conference Dates
May 11-14, 2003
Conference Location
Siena, 1, IT
Conference Title
7th IEEE Workshop on Signal Propagation on Interconnects
Pub Type
Conferences
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Keywords
calibration, high-impedance probe, invasiveness, loading, measurement, microwave
Citation
Issues
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Created May 13, 2003, Updated October 12, 2021