Arz, U.
, Kabos, P.
and Williams, D.
(2003),
Measuring the Invasiveness of High-Impedance Probes, Proc. IEEE Workshop on Signal Propagation on Interconnects, Siena, 1, IT, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31316
(Accessed October 11, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Measuring the Invasiveness of High-Impedance Probes
Published
Author(s)
, ,
Abstract
We use on-wafer measurements to characterize the invasiveness of high-impedance probes over a broad frequency range. We show that a two-port representation characterizing the invasiveness of the probe can also be determined from a calculation of the probe's load impedance, which is derived from a separate characterizatrion of the high-impednace probe.Proceedings Title
Proc. IEEE Workshop on Signal Propagation on Interconnects
Conference Dates
May 11-14, 2003
Conference Location
Siena, 1, IT
Conference Title
7th IEEE Workshop on Signal Propagation on Interconnects
Pub Type
Conferences
Download Paper
Keywords
calibration, high-impedance probe, invasiveness, loading, measurement, microwave
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact [email protected].
Created May 13, 2003, Updated October 12, 2021