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Lumped-Element Models for On-Wafer Calibration



Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley


We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.
Proceedings Title
Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference
Conference Dates
November 30-December 1, 2000
Conference Location
Boulder, CO


netowrk analyzer, on-waver calibration, OSLT, SOLR, SOLT, TRL calibration


Walker, D. , Kaiser, R. , Williams, D. and Coakley, K. (2000), Lumped-Element Models for On-Wafer Calibration, Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference, Boulder, CO, [online], (Accessed April 24, 2024)
Created December 1, 2000, Updated January 27, 2020