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Lumped-Element Models for On-Wafer Calibration

Published

Author(s)

Dave K. Walker, Raian K. Kaiser, Dylan F. Williams, Kevin J. Coakley

Abstract

We examine electrical models for lumped-element impedance standards used in on-wafer network-analyzer calibrations. We illustrate the advantages of using models that are complicated enough to replicate the actual electrical behavior of the lumped standards, but do not have more degrees of freedom than absolutely necessary.
Proceedings Title
Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference
Volume
38
Conference Dates
November 30-December 1, 2000
Conference Location
Boulder, CO

Keywords

netowrk analyzer, on-waver calibration, OSLT, SOLR, SOLT, TRL calibration

Citation

Walker, D. , Kaiser, R. , Williams, D. and Coakley, K. (2000), Lumped-Element Models for On-Wafer Calibration, Tech. Dig., Automatic Radio Frequency Techniques Group (ARFTG) Conference, Boulder, CO, [online], https://doi.org/10.1109/ARFTG.2000.327431 (Accessed April 24, 2024)
Created December 1, 2000, Updated January 27, 2020