Permittivity Characterization from Transmission-Line Measurement
Michael D. Janezic, Dylan F. Williams
We analyze three accurate broadband techniques for measuring the complex permittivity of dielectric substrates using coplanar waveguide transmission-line measurements and demonstrate good agreement with single-frequency cavity measurements.
Tech. Dig., IEEE MTT-S International Microwave Symposium
and Williams, D.
Permittivity Characterization from Transmission-Line Measurement, Tech. Dig., IEEE MTT-S International Microwave Symposium, Denver, CO, [online], https://doi.org/10.1109/MWSYM.1997.596577
(Accessed December 11, 2023)