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Permittivity Characterization from Transmission-Line Measurement

Published

Author(s)

Michael D. Janezic, Dylan F. Williams

Abstract

We analyze three accurate broadband techniques for measuring the complex permittivity of dielectric substrates using coplanar waveguide transmission-line measurements and demonstrate good agreement with single-frequency cavity measurements.
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Volume
3
Conference Dates
June 8-12, 1997
Conference Location
Denver, CO

Citation

Janezic, M. and Williams, D. (1997), Permittivity Characterization from Transmission-Line Measurement, Tech. Dig., IEEE MTT-S International Microwave Symposium, Denver, CO, [online], https://doi.org/10.1109/MWSYM.1997.596577 (Accessed June 21, 2024)

Issues

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Created June 1, 1997, Updated November 10, 2018