Yung, Lehman, Tomlin, Stephens, Vayshenker
Rigosi, Panna, Payagala, Jarrett, Elmquist, Jones
Levitan, Simiu, Pintar
Sunday, Kline, Windover
Perkins
Simmonds, Lehnert, Aumentado, Teufel
Shinder, Boyd, Filla, Johnson
Hudson, Paulter, Tosh
Boone, Luptak, Sherman, Jenkinson, Levine
Williams, Middleton
Ryan, Burnham, Blalock, Carson, Rodriguez
Kimes, Maslar, Sperling
Sisco, Forbes
Killgore
Bradley, Lauria, Slifka, Connolly
LaVan, Yi
Rodriguez, Pierce , Mahlberg, Burnham
Vertman, Lequin, Colucci-Rios, Solomon, Castillo, Lagas, Simpson, Marquis
Barton
Davis, Avila, Plante, Vanek, Zhang, Chung, Pandya, Medina-Smith, Greene
Alberding, Heilweil, Hadler
Sprow, Flynn, Liposky, Norbedo
Gentile
Cantilli, Neuberg
Wilson, Hite, Leibfried, Pappas
Stavis
Cooksey, Allen, Tsai
Garey, Rouil, Sun, Walton, Kahn
Fischer, Bailey, Eastman, Schaefer, Scott
Tseng, Allen, Gates, Venable, Mendonca, Raedeke, Hernandez, Kau, Materese, Stoughton
Polidoro, Ng
Cular
Leber, Schmitt, Virts, Filliben, Messina, Bostelman
Mell
Nelson, Lippa, Toman
Phinney, Sander, Camara, Lippa, Burdette, Bedner
Jimenez
The B. Stephen Carpenter award, established in 2017, is granted for outstanding achievements or contributions in building ties between NIST and the international measurement community, including other national metrology institutes and international organizations who play a role in the global measurement system.
Lombardi
Reiner
K. Martin
J. Martin
Schock
Generoso-Nguyen, Lawson
Clark
The Distinguished Career Award, established in 2017, is granted to employees who have made lasting, long-term contributions to NIST's mission and strategic goals throughout their career.
Lowe
M. Martin
Falco, Marvel, Muralikrishnan, Shilling, Franaszek, Cheok, Rachakonda, Bostelman, Saidi, Li-Baboud
Wallis, Kabos
Hight Walker
Miller
Smith
Murphy
Daniels
Phillips
Toth
Feeney, Hedberg
DesChamps
Porter, Donahue
Germer, Patrick, Zarobila, Cooksey
Podobedov, Curry, Houston, Eppeldauer, Yoon, Shaw
Perkins
Garst
Davis
Connelly, Saidi, Thompson
Rabb, Vocke
Ilic (photo not available)