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NRC Postdoctoral Opportunities in the Nanoscale Device Characterization Division

The National Research Council (NRC) operates Research Associateship Programs in cooperation with a number of sponsoring federal laboratories and research organizations. For NIST, the NRC Research Associate Program consists of a national competition in which outstanding scientists and engineers with recent PhDs are awarded postdoctoral fellowships. Opportunities exist through this program to work on cutting edge research with leading scientists in laboratories across NIST.

Program Information for NIST | NRC RAP Home Page


List of NRC Postdoctoral Opportunities in the Nanoscale Device Characterization Division
50.68.31.C0375 NISTAccurately Establishing Uncertainties from Artificial IntelligenceBryan Barnes
50.68.31.B8479 NISTActinic Optical Dimensional Characterization of Deep-Subwavelength NanostructuresBryan Barnes
50.68.31.B8528 NISTAdvanced Electronic Structure Measurements of Novel Materials and DevicesSujitra Pookpanratana
50.68.31.C0059 NISTAdvanced New Memory DevicesCharles Cheung
50.68.31.B8024 NISTAtom-based Silicon Quantum Electronics for Quantum Computing and Analog Quantum SimulationRichard Silver
50.68.41.B5919 NISTAtom-based Solid-state Quantum Devices and SimulatorsGarnett Bryant
50.68.03.B4069 NISTAtomic Scale Characterization and ManipulationJoseph Stroscio
50.68.31.C0451 NISTCounting Single Photons and Single Electrons Together for Metrology and Quantum InformationNeil Zimmerman
50.68.03.C0285 NISTDevices, Circuits and Architectures for Neuromorphic ComputingJabez McClelland, Mark Stiles
50.68.03.B8513 NISTElectron Spectroscopy and Microscopy in Liquids and GasesAndrei Kolmakov
50.68.31.B8247 NISTEnriched Silicon Quantum DevicesJoshua Pomeroy
50.68.31.B8456 NISTFemtosecond Time-Resolved Measurements in Semiconductor MaterialsEdwin Heilweil, Angela Hight Walker
50.68.03.C0334 NISTFemtosecond Time-resolved Optical Measurements in Condensed MatterJared Wahlstrand
50.68.31.B6418 NISTFunctionalizing Semiconductor SurfacesChristina Hacker
50.68.31.B8259 NISTHigh Frequency Electrical Metrology for Three-Dimensional Integrated CircuitsYaw Obeng
50.68.03.B8512 NISTIn Situ SEM-Raman Spectromicroscopy of Working Devices and Active Interfaces under Realistic Conditions: in Liquids and GasesAndrei Kolmakov
50.68.31.B4752 NISTInterface Engineering: Using Surface Chemistry to Impart Desired PropertiesChristina Hacker
50.68.03.B8134 NISTMeasurements for Resistive Switching DevicesAndrea Centrone, Jabez McClelland, Nikolai Zhitenev
50.68.03.B8196 NISTNanomagnetism-DynamicsRobert McMichael
50.68.03.B8041 NISTNanoscale Infrared Spectroscopy (AFM-IR, PTIR) Advances and ApplicationsAndrea Centrone
50.68.03.C0427 NISTNanoscale Spectroscopy (AFM-IR, PTIR, STML) for Strongly Correlated Materials at Cryogenic TemperaturesAndrea Centrone
50.68.31.C0060 NISTNew Electron-Spin-Resonance Method for New ApplicationsCharles Cheung
50.68.31.C0448 NISTOrganic and Thin Film ElectronicsDavid Gundlach
50.68.03.B7674 NISTPrecision Materials for Quantum DevicesJoshua Pomeroy
50.68.31.B8390 NISTPhysical, Chemical, and Biological Studies using Spin ResonanceJason Campbell, Jason Ryan
50.68.31.B7002 NISTQuantum Information Applications of Si Single Electron Tunneling DevicesNeil Zimmerman
50.68.03.C0305 NISTRelating Physics to Performance in Organic Electronic DevicesEmily Bittle
50.68.31.B1498 NISTScanning Probe MetrologyJoseph Kopanski
50.68.31.B8478 NISTSingle Electron Devices for Quantum Information and Metrology in SiliconMichael Stewart
50.68.31.B8389 NISTSolid-State Device Reliability and ResiliencyJason Campbell, Jason Ryan
50.68.03.B8034 NISTTheoretical Condensed Matter PhysicsPaul Haney
50.68.03.B1737 NISTTheoretical Condensed Matter PhysicsMark Stiles
50.68.03.C0419 NISTTwo-Dimensional (2-D) Heterostructure Devices and Twisted SystemsCurt Richter, Nikolai Zhitenev
50.68.31.B7877 NISTUltrafast Condensed-Phase Dynamics Using Mid-Infrared and Terahertz SpectroscopyEdwin Heilweil


Created February 9, 2021, Updated February 22, 2024