The National Research Council (NRC) operates Research Associateship Programs in cooperation with a number of sponsoring federal laboratories and research organizations. For NIST, the NRC Research Associate Program consists of a national competition in which outstanding scientists and engineers with recent PhDs are awarded postdoctoral fellowships. Opportunities exist through this program to work on cutting edge research with leading scientists in laboratories across NIST.
Program Information for NIST | NRC RAP Home Page
List of NRC Postdoctoral Opportunities in the Nanoscale Device Characterization Division| RO# | Title | Host(s) |
|---|
| 50.68.31.C0375 NIST | Accurately Establishing Uncertainties from Artificial Intelligence | Bryan Barnes |
| 50.68.31.B8479 NIST | Actinic Optical Dimensional Characterization of Deep-Subwavelength Nanostructures | Bryan Barnes |
| 50.68.31.B8528 NIST | Advanced Electronic Structure Measurements of Novel Materials and Devices | Sujitra Pookpanratana |
| 50.68.31.C0059 NIST | Advanced New Memory Devices | Charles Cheung |
| 50.68.31.B8024 NIST | Atom-based Silicon Quantum Electronics for Quantum Computing and Analog Quantum Simulation | Richard Silver |
| 50.68.41.B5919 NIST | Atom-based Solid-state Quantum Devices and Simulators | Garnett Bryant |
| 50.68.03.B4069 NIST | Atomic Scale Characterization and Manipulation | Joseph Stroscio |
| 50.68.31.C0451 NIST | Counting Single Photons and Single Electrons Together for Metrology and Quantum Information | Neil Zimmerman |
| 50.68.03.C0285 NIST | Devices, Circuits and Architectures for Neuromorphic Computing | Jabez McClelland, Mark Stiles |
| 50.68.03.B8513 NIST | Electron Spectroscopy and Microscopy in Liquids and Gases | Andrei Kolmakov |
| 50.68.31.B8247 NIST | Enriched Silicon Quantum Devices | Joshua Pomeroy |
| 50.68.31.B8456 NIST | Femtosecond Time-Resolved Measurements in Semiconductor Materials | Angela Hight Walker |
| 50.68.03.C0334 NIST | Femtosecond Time-resolved Optical Measurements in Condensed Matter | Jared Wahlstrand |
| 50.68.31.B6418 NIST | Functionalizing Semiconductor Surfaces | Christina Hacker |
| 50.68.31.B8259 NIST | High Frequency Electrical Metrology for Three-Dimensional Integrated Circuits | Yaw Obeng |
| 50.68.03.B8512 NIST | In Situ SEM-Raman Spectromicroscopy of Working Devices and Active Interfaces under Realistic Conditions: in Liquids and Gases | Andrei Kolmakov |
| 50.68.31.B4752 NIST | Interface Engineering: Using Surface Chemistry to Impart Desired Properties | Christina Hacker |
| 50.68.03.B8134 NIST | Measurements for Resistive Switching Devices | Andrea Centrone, Jabez McClelland, Nikolai Zhitenev |
| 50.68.03.B8196 NIST | Nanomagnetism-Dynamics | Robert McMichael |
| 50.68.03.B8041 NIST | Nanoscale Infrared Spectroscopy (AFM-IR, PTIR) Advances and Applications | Andrea Centrone |
| 50.68.03.C0427 NIST | Nanoscale Spectroscopy (AFM-IR, PTIR, STML) for Strongly Correlated Materials at Cryogenic Temperatures | Andrea Centrone |
| 50.68.31.C0060 NIST | New Electron-Spin-Resonance Method for New Applications | Charles Cheung |
| 50.68.31.C0448 NIST | Organic and Thin Film Electronics | David Gundlach |
| 50.68.03.B7674 NIST | Precision Materials for Quantum Devices | Joshua Pomeroy |
| 50.68.31.B8390 NIST | Physical, Chemical, and Biological Studies using Spin Resonance | Jason Campbell, Jason Ryan |
| 50.68.31.B7002 NIST | Quantum Information Applications of Si Single Electron Tunneling Devices | Neil Zimmerman |
| 50.68.03.C0305 NIST | Relating Physics to Performance in Organic Electronic Devices | Emily Bittle |
| 50.68.31.B1498 NIST | Scanning Probe Metrology | Joseph Kopanski |
| 50.68.31.B8478 NIST | Single Electron Devices for Quantum Information and Metrology in Silicon | Michael Stewart |
| 50.68.31.B8389 NIST | Solid-State Device Reliability and Resiliency | Jason Campbell, Jason Ryan |
| 50.68.03.B8034 NIST | Theoretical Condensed Matter Physics | Paul Haney |
| 50.68.03.B1737 NIST | Theoretical Condensed Matter Physics | Mark Stiles |
| 50.68.03.C0419 NIST | Two-Dimensional (2-D) Heterostructure Devices and Twisted Systems | Curt Richter, Nikolai Zhitenev |
| 50.68.31.B7877 NIST | Ultrafast Condensed-Phase Dynamics Using Mid-Infrared and Terahertz Spectroscopy | Edwin Heilweil |
