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Physical Measurement Laboratory

Nanoscale Device Characterization Division

NRC Postdoctoral Opportunities in the Nanoscale Device Characterization Division

The National Research Council (NRC) operates Research Associateship Programs in cooperation with a number of sponsoring federal laboratories and research organizations. For NIST, the NRC Research Associate Program consists of a national competition in which outstanding scientists and engineers with recent PhDs are awarded postdoctoral fellowships. Opportunities exist through this program to work on cutting edge research with leading scientists in laboratories across NIST.

Program Information for NIST | NRC RAP Home Page

List of NRC Postdoctoral Opportunities in the Nanoscale Device Characterization Division
RO#	Title	Host(s)
50.68.31.C0375 NIST	Accurately Establishing Uncertainties from Artificial Intelligence	Bryan Barnes
50.68.31.B8479 NIST	Actinic Optical Dimensional Characterization of Deep-Subwavelength Nanostructures	Bryan Barnes
50.68.31.B8528 NIST	Advanced Electronic Structure Measurements of Novel Materials and Devices	Sujitra Pookpanratana
50.68.31.C0059 NIST	Advanced New Memory Devices	Charles Cheung
50.68.31.B8024 NIST	Atom-based Silicon Quantum Electronics for Quantum Computing and Analog Quantum Simulation	Richard Silver
50.68.41.B5919 NIST	Atom-based Solid-state Quantum Devices and Simulators	Garnett Bryant
50.68.03.B4069 NIST	Atomic Scale Characterization and Manipulation	Joseph Stroscio
50.68.31.C0451 NIST	Counting Single Photons and Single Electrons Together for Metrology and Quantum Information	Neil Zimmerman
50.68.03.C0285 NIST	Devices, Circuits and Architectures for Neuromorphic Computing	Jabez McClelland, Mark Stiles
50.68.03.B8513 NIST	Electron Spectroscopy and Microscopy in Liquids and Gases	Andrei Kolmakov
50.68.31.B8247 NIST	Enriched Silicon Quantum Devices	Joshua Pomeroy
50.68.31.B8456 NIST	Femtosecond Time-Resolved Measurements in Semiconductor Materials	Edwin Heilweil, Angela Hight Walker
50.68.03.C0334 NIST	Femtosecond Time-resolved Optical Measurements in Condensed Matter	Jared Wahlstrand
50.68.31.B6418 NIST	Functionalizing Semiconductor Surfaces	Christina Hacker
50.68.31.B8259 NIST	High Frequency Electrical Metrology for Three-Dimensional Integrated Circuits	Yaw Obeng
50.68.03.B8512 NIST	In Situ SEM-Raman Spectromicroscopy of Working Devices and Active Interfaces under Realistic Conditions: in Liquids and Gases	Andrei Kolmakov
50.68.31.B4752 NIST	Interface Engineering: Using Surface Chemistry to Impart Desired Properties	Christina Hacker
50.68.03.B8134 NIST	Measurements for Resistive Switching Devices	Andrea Centrone, Jabez McClelland, Nikolai Zhitenev
50.68.03.B8196 NIST	Nanomagnetism-Dynamics	Robert McMichael
50.68.03.B8041 NIST	Nanoscale Infrared Spectroscopy (AFM-IR, PTIR) Advances and Applications	Andrea Centrone
50.68.03.C0427 NIST	Nanoscale Spectroscopy (AFM-IR, PTIR, STML) for Strongly Correlated Materials at Cryogenic Temperatures	Andrea Centrone
50.68.31.C0060 NIST	New Electron-Spin-Resonance Method for New Applications	Charles Cheung
50.68.31.C0448 NIST	Organic and Thin Film Electronics	David Gundlach
50.68.03.B7674 NIST	Precision Materials for Quantum Devices	Joshua Pomeroy
50.68.31.B8390 NIST	Physical, Chemical, and Biological Studies using Spin Resonance	Jason Campbell, Jason Ryan
50.68.31.B7002 NIST	Quantum Information Applications of Si Single Electron Tunneling Devices	Neil Zimmerman
50.68.03.C0305 NIST	Relating Physics to Performance in Organic Electronic Devices	Emily Bittle
50.68.31.B1498 NIST	Scanning Probe Metrology	Joseph Kopanski
50.68.31.B8478 NIST	Single Electron Devices for Quantum Information and Metrology in Silicon	Michael Stewart
50.68.31.B8389 NIST	Solid-State Device Reliability and Resiliency	Jason Campbell, Jason Ryan
50.68.03.B8034 NIST	Theoretical Condensed Matter Physics	Paul Haney
50.68.03.B1737 NIST	Theoretical Condensed Matter Physics	Mark Stiles
50.68.03.C0419 NIST	Two-Dimensional (2-D) Heterostructure Devices and Twisted Systems	Curt Richter, Nikolai Zhitenev
50.68.31.B7877 NIST	Ultrafast Condensed-Phase Dynamics Using Mid-Infrared and Terahertz Spectroscopy	Edwin Heilweil

Nanotechnology and Nanoelectronics

Created February 9, 2021, Updated February 22, 2024