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Michael Stewart (Fed)

Michael Stewart is an experimental physicist at the National Institute for Standards and Technology (NIST) in the Atom Scale Devices Group. He performs fundamental research in silicon single electron devices to build a standard of the electrical current based on the elementary charge, and for use as qubits in the solid state. He is focused on fabrication methods, materials, and measurement techniques which give stable, clean devices with high yield. This work involves fabricating and measuring the impact of device design, materials choices, and defect levels on device performance to remove deleterious effects while also designing measurement techniques which mitigate those effects. Moreover, we perform single electron pumping measurements and quantum coherent measurements while working on techniques to integrate devices together. Dr. Stewart graduated from Brown University with a M.S. and Ph.D. in physics and received his undergraduate degree in physics and mathematics from the University of Wisconsin - Madison.

Projects

Silicon-based Quantum Ampere
Si-Based Single Spin Coherence and Manipulation

Selected News

NIST-on-a-Chip: Quantum-Based Electrical Standards – Current

Publications

Multi-scale alignment to buried atom-scale devices using Kelvin probe force microscopy

Author(s)
Pradeep Namboodiri, Jonathan Wyrick, Gheorghe Stan, Xiqiao Wang, Fan Fei, Ranjit Kashid, Scott Schmucker, Richard Kasica, Bryan Barnes, Michael Stewart, Richard M. Silver
Fabrication of quantum devices by atomic scale patterning with a Scanning Tunneling Microscope (STM) has led to the development of single/few atom transistors

Electron-electron interactions in low-dimensional Si:P delta layers

Author(s)
Joseph Hagmann, Xiqiao Wang, Ranjit Kashid, Pradeep Namboodiri, Jonathan Wyrick, Scott W. Schmucker, Michael Stewart, Richard M. Silver, Curt A. Richter
Key to producing quantum computing devices based on the atomistic placement of dopants in silicon by scanning tunneling microscope (STM) lithography is the
Created October 23, 2018, Updated December 8, 2022