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Kin (Charles) Cheung (Fed)

Dr. Cheung is a physical scientist in the Nanoscale Imaging Group in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). Prior to joining NIST in 2007, Dr. Cheung was an associate professor in Rutgers University. Prior to Rutgers University, Dr. Cheung spent 18 Years as a member of the technical staff at Bell Laboratories in Murray Hill, NJ. Dr. Cheung published over 140 refereed journal and conference papers. He has written a monograph entitled "Plasma Charging Damage" which published in 2000. He holds 6 patents. Dr. Cheung taught tutorials in many international conferences. He also served in the committees of many of these conferences. Dr. Cheung received the Bell Lab President's Gold Award in 1997, and the Outstanding Achievement Award from the International Symposium on Plasma Process-Induced Damage.

Publications

Patents

Image of diagrams for the Classic Mach - Zehnder interferometer, Microwae transmission line based vserion, and guided wave probe tip interacts with sample

Phase Shift Detector Process for Making and Use of Same

NIST Inventors
Kin (Charles) Cheung, Jason Ryan and Jason Campbell
Patent Description The new NIST detector senses very small phase shifts in a highly balanced microwave bridge. An electric field optimized microwave probe, in close proximity to a sample, serves to perturb the degree of bridge balance due to a change in effective dielectric constant of the sample
Created August 15, 2019, Updated June 15, 2021