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Search Patents by Kin (Charles) Cheung

Displaying 1 - 2 of 2

Massively parallel wafer-level reliability system and process for massively parallel wafer-level reliability testing

NIST Inventors

Kin (Charles) Cheung

Patent Description The massively parallel reliability (MPR) system is a measurement platform where thousands of semiconductor devices are tested for long term reliability. The system is designed to perform some of the standard reliability tests for certain degradation mechanisms in semiconductor

Image of diagrams for the Classic Mach - Zehnder interferometer, Microwae transmission line based vserion, and guided wave probe tip interacts with sample

Phase Shift Detector Process for Making and Use of Same

NIST Inventors

Kin (Charles) Cheung, Jason Ryan and Jason Campbell

Patent Description The new NIST detector senses very small phase shifts in a highly balanced microwave bridge. An electric field optimized microwave probe, in close proximity to a sample, serves to perturb the degree of bridge balance due to a change in effective dielectric constant of the sample