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Robert D. McMichael (Fed)

Robert (Bob) McMichael is a Project Leader in the Nanoscale Processes and Measurements Group in the Nanoscale Device Characterization Division. He received a B.S. in Engineering-Physics from Pacific Lutheran University, and an M.S. and a Ph.D. in Physics from the Ohio State University. He came to NIST on an NRC Postdoctoral Research Fellowship in 1990, served on the research staff of the Metallurgy Division in the Materials Science and Engineering Lab, and then joined the CNST in 2007. Bob's research at NIST has touched on a broad spectrum of phenomena in magnetic thin films and nanomaterials, but remains centered on micromagnetics and magnetization dynamics. He has over 160 peer-reviewed publications, and is a frequent invited speaker at international meetings. In 2004 Bob was selected as an IEEE Magnetics Society Distinguished Lecturer, and in 2009 he became a Fellow of the American Physical Society. Bob has received NIST's Samuel Wesley Stratton Award and Bronze Medal Award, and also the Silver Medal Award from the US Department of Commerce.

Selected Programs/Projects

Selected Publications


Robust spin relaxometry with fast adaptive Bayesian estimation

Michael Caouette-Mansour, Adrian Solyom, Brandon Ruffolo, Robert D. McMichael, Jack Childress (Sankey), Lilian Childress
Spin relaxometry with nitrogen-vacancy (NV) centers in diamond offers a spectrally selective, atomically localized, and calibrated measurement of microwave

Artifacts That Could Be Misinterpreted as Ballistic Magnetoresistance

William F. Egelhoff Jr., L Gan, Erik B. Svedberg, Cedric J. Powell, Alexander J. Shapiro, Robert McMichael, J Mallett, Thomas P. Moffat, Mark D. Stiles
Theoretical physics suggests that very large magnetoresistance (MR) values might be found in certain magnetic nanocontacts if a magnetic domain wall could be

Thin Film Edge Property Measurements by Edge Saturation

Brian B. Maranville, Robert McMichael, Cindi L. Dennis, C A. Ross, J Cheng
Two techniques are described for characterizing the magnetic properties of the edges in long, straight magnetic stripes, using vector magnetometry. The critical
Created May 21, 2019, Updated July 11, 2022