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Ferromagnetic Resonance Line Width in Inhomogeneous Thin Films

Published

Author(s)

Robert McMichael, A B. Kunz, D J. Twisselmann

Abstract

The dynamic properties of magnetic materials are important for magnetic data storage. The primary measurement technique for understanding magnetization damping is ferromagnetic resonance line width. Because materials inhomogeneities increase experimental line width values, it is important to understand the contribution of nanometer scale defects for meaningful measurements of damping. Until recently, the two-magnon model of scattering was thought to describe apparent damping due to magnetic defects. In this paper, eigenmodes and ferromagnetic resonance spectra are determined by diagonalization of a spin wave Hamiltonian for ferromagnetic thin films with inhomogeneities. The resonance line broadening is described by a distribution of the FMR intensity over a range of frequencies rather than to energy losses to spin wave modes. Calculated line width results show a linear frequency dependence of the ferromagnetic resonance line width with slope and zero-frequency intercept. These results contrast with the two magnon model and its prediction of a nonlinear frequency dependence.
Citation
Physical Review Letters

Keywords

damping, inhomogeneous thin films, magnetization dynamics, nanomagnetodynamics

Citation

McMichael, R. , Kunz, A. and Twisselmann, D. (2021), Ferromagnetic Resonance Line Width in Inhomogeneous Thin Films, Physical Review Letters (Accessed May 22, 2024)

Issues

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Created October 12, 2021