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Jason Ryan (Fed)

Dr. Ryan is leader of the Magnetic Resonance Spectroscopy Project in the Alternative Computing Group in the Nanoscale Device Characterization Division of the Physical Measurement Laboratory (PML). He received the B.S. degree in Physics from Millersville University, Millersville, PA in 2004. He received the M.S. degree in Engineering Science and a Ph.D. in Materials Science and Engineering from The Pennsylvania State University, University Park, PA in 2006 and 2010, respectively. In 2010, he was awarded a National Research Council (NRC) post-doctoral fellowship which he spent at NIST where he is still currently employed. He has contributed to more than 65 peer reviewed technical publications and over 100 presentations at international conferences. Dr. Ryan also holds 3 patents. He has been heavily involved in the technical and managerial committees of both the IEEE International Reliability Physics Symposium and IEEE International Integrated Reliability Workshop conferences, having served as General Chair of the latter in 2015. His research interests involve utilizing magnetic resonance spectroscopy to understand the physics and kinetics of atomic-scale defects responsible for critical failure and drift mechanisms in advanced electronic devices and materials.


Selected Publications


Model for the Bipolar Amplification Effect

James Ashton, Stephen Moxim, Ashton Purcell, Patrick Lenahan, Jason Ryan
We present a model based on Fitzgerald-Grove surface recombination for the bipolar amplification effect (BAE) measurement, which is widely utilized in

Patents (2018-Present)

Image of diagrams for the Classic Mach - Zehnder interferometer, Microwae transmission line based vserion, and guided wave probe tip interacts with sample

Phase Shift Detector Process for Making and Use of Same

NIST Inventors
Kin (Charles) Cheung , Jason Ryan and Jason Campbell
Patent Description The new NIST detector senses very small phase shifts in a highly balanced microwave bridge. An electric field optimized microwave probe, in close proximity to a sample, serves to perturb the degree of bridge balance due to a change in effective dielectric constant of the sample
Created March 12, 2019, Updated December 8, 2022