Emily Bittle is a staff physicist in the Nanoscale Device Characterization Division. Her research focuses on refining the understanding and applications of physical processes impacting semiconductor device performance through electrical and opto-electrical measurements. She is currently researching device physics aimed at color center readout in semiconductor electronics to develop sensing and quantum measurements applications.
Dr. Bittle received the DOC Bronze Medal in 2017 for accelerating the emergence of a new generation of flexible electronic devices by improving flawed standard measurement practices. She has served on the IOP Flexible and Printed Electronics editorial board since 2018 and co-chairs the SPIE Physical Chemistry of Semiconductor Materials and Interfaces conference.
Dr. Bittle is currently on detail as the Technology Partnership Office Ambassador and serves as the Technology Transfer Liaison representing NIST Physical Measurement Laboratory.