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Neil M. Zimmerman (Fed)
Neil M. Zimmerman is an experimental physicist at the National Institute for Standards and Technology (NIST) in the Atom Scale Devices Group. He performs fundamental research in silicon single electron devices to build a standard of the electrical current based on the elementary charge, and for use as qubits in the solid state. He is focused on measurements in, and optimization of i) devices made with atomic precision; ii) single-electron pumping for a standard of electrical current; iii) non-idealities in silicon quantum dots, including a) noise and stability, and b) quantum dots formed by mechanical strain. He has authored/co-authored about 60 peer-reviewed articles, has an h-index of 23, and has won several awards including the NIST Condon Award.