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Neil M. Zimmerman (Fed)

Neil M. Zimmerman is an experimental physicist at the National Institute for Standards and Technology (NIST) in the Atom Scale Devices Group. He performs fundamental research in silicon single electron devices to build a standard of the electrical current based on the elementary charge, and for use as qubits in the solid state. He is focused on measurements in, and optimization of i) devices made with atomic precision; ii) single-electron pumping for a standard of electrical current; iii) non-idealities in silicon quantum dots, including a) noise and stability, and b) quantum dots formed by mechanical strain.  He has authored/co-authored about 60 peer-reviewed articles, has an h-index of 23, and has won several awards including the NIST Condon Award.

Projects

Silicon-based Quantum Ampere

Si-Based Single Spin Coherence and Manipulation

Publications

National Institute of Standards and Technology Environmental Scan 2020

Author(s)
Heather Evans, Kristen K. Greene, William M. Healy, Elizabeth Hoffman, Kate Rimmer, Anna V. Sberegaeva, Neil M. Zimmerman
The 2020 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the

The Next Generation of Current Measurement for Ionization Chambers

Author(s)
Ryan P. Fitzgerald, Denis E. Bergeron, Dean G. Jarrett, Neil M. Zimmerman, Carine Michotte, Hansjoerg Scherer, Stephen Giblin, Steven Judge
Re-entrant ionization chambers (ICs) are essential to radionuclide metrology and nuclear medicine for maintaining standards and measuring half-lives. Metrology

Ohms Law Low-current Calibration System for Ionization Chambers

Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor
Created May 21, 2019, Updated June 15, 2021