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Neil M. Zimmerman (Fed)

Neil M. Zimmerman is an experimental physicist at the National Institute for Standards and Technology (NIST) in the Atom Scale Devices Group. He performs fundamental research in silicon single electron devices to build a standard of the electrical current based on the elementary charge, and for use as qubits in the solid state. He is focused on measurements in, and optimization of i) devices made with atomic precision; ii) single-electron pumping for a standard of electrical current; iii) non-idealities in silicon quantum dots, including a) noise and stability, and b) quantum dots formed by mechanical strain.  He has authored/co-authored about 60 peer-reviewed articles, has an h-index of 23, and has won several awards including the NIST Condon Award.


Silicon-based Quantum Ampere

Si-Based Single Spin Coherence and Manipulation


National Institute of Standards and Technology Environmental Scan 2020

Heather Evans, Kristen K. Greene, William M. Healy, Elizabeth Hoffman, Kate Rimmer, Anna V. Sberegaeva, Neil M. Zimmerman
The 2020 National Institute of Standards and Technology Environmental Scan provides an analysis of key external factors that could impact NIST and the

The Next Generation of Current Measurement for Ionization Chambers

Ryan P. Fitzgerald, Denis E. Bergeron, Dean G. Jarrett, Neil M. Zimmerman, Carine Michotte, Hansjoerg Scherer, Stephen Giblin, Steven Judge
Re-entrant ionization chambers (ICs) are essential to radionuclide metrology and nuclear medicine for maintaining standards and measuring half-lives. Metrology
Created May 21, 2019, Updated December 8, 2022