Joseph Stroscio is a Project Leader and NIST Fellow in the Nanoscale Processes and Measurements Group. He received a B.S. and an M.S. in Physics from the University of Rhode Island. Joe received a second M.S. and a Ph.D. in Physics from Cornell University working in the group of Professor Wilson Ho. Prior to joining NIST in 1987, he worked as a postdoctoral researcher at the IBM T. J. Watson Research Center, where he pioneered the development of scanning tunneling microscopy and spectroscopy measurements. At NIST, Joe leads multiple projects in nanoscale physics and technology. His research has encompassed areas including: atomic manipulation; the physical properties of nanostructures; nanoscale magnetism; the epitaxial growth of metal and semiconductor systems; and low-dimensional electron systems in graphene and related 2D materials. Joe has designed and constructed numerous state-of-the-art scanning probe systems involving creative custom designs that operate in ultra-high vacuum, at ultra-low temperatures, and in ultra-high magnetic field environments. He is a Fellow of the American Association for the Advancement of Science (AAAS), the American Physical Society (APS), and the American Vacuum Society (AVS). He has received the Arthur S. Flemming Award, the Department of Commerce Silver Medal Award, the Sigma Xi Young Scientist Award, the Department of Commerce Gold Medal Award, the Nano50 Award, the AVS Nanotechnology Recognition Award, and the NIST Samuel Wesley Stratton Award, and was the recipient of the Presidential Rank Award. He has served on numerous committees of the AVS, APS, and on the Editorial Board of the Review of Scientific Instruments. He has authored or coauthored over 110 peer reviewed publications with over 8000 citations and has given over 290 presentations.