Jason P. Campbell received his B.S. and Ph.D. degrees from the Pennsylvania State University. He currently leads the Advanced Electronics Group at the National Institute of Standards and Technology (NIST). He has contributed to more than 130 refereed papers and conference proceedings at national and international conferences and holds 3 patents. His research interests include the fundamental physics governing the performance, reliability, and scalability of advanced devices, power electronic devices, and devices which operate in extreme conditions. He also has extensive experience developing a wide range of magnetic resonance analytical measurements. He has served on numerous technical and managerial IEEE conference committees and as the general chair of the 2013 International Integrated Reliability Workshop (IIRW).