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Jason Campbell (Fed)

Group Leader

Jason P. Campbell received his B.S. and Ph.D. degrees from the Pennsylvania State University. He currently leads the Advanced Electronics Group at the National Institute of Standards and Technology (NIST). He has contributed to more than 130 refereed papers and conference proceedings at national and international conferences and holds 3 patents. His research interests include the fundamental physics governing the performance, reliability, and scalability of advanced devices, power electronic devices, and devices which operate in extreme conditions. He also has extensive experience developing a wide range of magnetic resonance analytical measurements. He has served on numerous technical and managerial IEEE conference committees and as the general chair of the 2013 International Integrated Reliability Workshop (IIRW).

Google Scholar

Selected Publications

Random Telegraph Noise in Highly Scaled nMOSFETs

Author(s)
Jason P. Campbell, Jin Qin, Kin P. Cheung, Liangchun (. Yu, John S. Suehle, A Oates, Kuang Sheng
Recently 1/f and random telegraph noise (RTN) studies have been used to infer information about bulk dielectric defects' spatial and energetic distributions

Publications

High-endurance bulk CMOS one-transistor cryo-memory

Author(s)
Alexander Zaslavsky, Pragya Shrestha, Valery Ortiz Jimenez, Jason Campbell, Curt Richter
Previously we reported a compact one-transistor (1T) 180 nm bulk CMOS cryo-memory with a high 10^7 I_1/I_0 memory window and long 800 s retention time based on

A 4-mW 2.2-6.9 GHz LNA in 16nm FinFET Technology for Cryogenic Applications

Author(s)
Runzhou Chen, Hamdi Mani, Phil Marsh, Richard Al Hadi, Pragya Shrestha, Jason Campbell, Christopher Chen, Hao-Yu Chen, Kosmas Galatsis, Mau-Chung Frank Chang
This work presents the design and measurement of a low-power wide-band cryogenic low-noise amplifier (LNA) that operates in a wide temperature range using 16nm

Characterization of Noise in CMOS Ring Oscillators at Cryogenic Temperatures

Author(s)
Prashansa Mukim, Pragya Shrestha, Advait Madhavan, Nitin Prasad, Jason Campbell, Forrest Brewer, Mark Stiles, Jabez J. McClelland
Allan deviation provides a means to characterize the time-dependence of noise in oscillators and potentially identify the source characteristics. Measurements
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Patents (2018-Present)

Non-Resonant Electron Spin Resonant Probe And Associated Hardware

NIST Inventors
Jason Campbell , Jason Ryan , Kin (Charles) Cheung , Robert Gougelet and Pragya Shrestha
This invention details a non-resonant probe designed to measure changes in the density of broken bonds (unpaired electrons) in materials exposed to ionizing radiation. The probe functions to excite and detect electron spin resonance transitions in these materials. Accumulated radiation dose can then
Image of diagrams for the Classic Mach - Zehnder interferometer, Microwae transmission line based vserion, and guided wave probe tip interacts with sample

Phase Shift Detector Process for Making and Use of Same

NIST Inventors
Kin (Charles) Cheung , Jason Ryan and Jason Campbell
The detector senses very small phase shifts in a highly balanced microwave bridge. An electric field optimized microwave probe, in close proximity to a sample, serves to perturb the degree of bridge balance due to a .change in effective dielectric constant of the sample. The major innovation
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Created August 15, 2019, Updated January 31, 2025