Shrestha, P.
, Akturk, A.
, Hoskins, B.
, Madhavan, A.
and Campbell, J.
(2023),
Ultrafast ID-VG Technique for Reliable Cryogenic Device Characterization, IEEE Journal of the Electron Devices Society, [online], https://doi.org/10.1109/JEDS.2023.3259823, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932679
(Accessed October 14, 2024)