@article{936736,
  author = {Pragya Shrestha and Akin Akturk and Brian Hoskins and Advait Madhavan and Jason Campbell},
  title = {Ultrafast ID-VG Technique for Reliable Cryogenic Device Characterization},
  year = {2023},
  number = {11},
  month = {2023-03-21 04:03:00},
  publisher = {IEEE Journal of the Electron Devices Society},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=932679},
  doi = {https://doi.org/10.1109/JEDS.2023.3259823},
  language = {en},
}