U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Dylan Williams (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 226 - 250 of 583

A statistical study of de-embedding applied to eye diagram analysis

February 1, 2012
Author(s)
Paul D. Hale, Jeffrey A. Jargon, Chih-Ming Wang, Brett Grossman, Matthew Claudius, Jose Torres, Andrew M. Dienstfrey, Dylan F. Williams
We describe a stable method for calibrating digital waveforms and eye diagrams using the measurement system response function and its regularized inverse. The function describing the system response includes the response of the oscilloscope and any

500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

October 31, 2011
Author(s)
Dylan F. Williams
We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art rectangular-waveguide vector-network-analyzer measurements over the frequency range 500 GHz – 750 GHz. We use the analysis to assess thru-reflect

On-Chip Security Using Electromagnetic Analysis

October 27, 2011
Author(s)
James Schaffner, Dylan Williams
In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic

Radiation, Multimode Propagation, and Substrate Modes in W-Band CPW Calibrations

October 10, 2011
Author(s)
Dylan F. Williams, Franz-Joseph Schmuckle, Ralf Dorner, G.N. Phung, Wolfgang Heinrich, Uwe Arz
We investigate the degradation of the accuracy of coplanar waveguide calibration standards at higher frequencies due to multi-mode propagation, substrate modes, and radiation. Based on a typical calibration substrate, we investigate these effects and their

Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements

September 28, 2010
Author(s)
Arkadiusz C. Lewandowski, Dylan F. Williams, Wojciech Wiatr
We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm to

Editorial: Message From the Outgoing Editors

September 10, 2010
Author(s)
Dylan F. Williams
Some four years ago, we took the responsibility for editing this TRANSACTIONS. Our editorial duties have now ended. It has been a privilege and honor to serve our readers and our authors.

Editorial: Editorial re. Associate Editors

August 1, 2010
Author(s)
Dylan F. Williams
Our editing team is key to the success of the Transactions. The Associate Editors who commit to a term of service are dedicated individual who work on a strictly voluntary basis to ensure the high quality of the manuscripts that are published. this is not

Use of Electronic Calibration Units for Vector-Network-Analyzer Verification

July 30, 2010
Author(s)
Dylan F. Williams, Arkadiusz C. Lewandowski, Denis X. LeGolvan, Ronald A. Ginley, Chih-Ming Wang, Jolene D. Splett
We present measurements indicating that electronic calibration units are stable enough to be used in place of mechanical vector-network-analyzer verification artifacts. This enables a new fully automated approach to verifying microwave vector-network

A New Electronic Verification Method for Vector Network Analyzers

June 13, 2010
Author(s)
Ronald A. Ginley, Dylan F. Williams, Denis X. LeGolvan
The National Institute of Standards and Technology (NIST) has recently introduced a new method for the verification of Vector Network Analyzers (VNAs). The technique is based on the new electronic calibration units that are available from several