Williams, D.
(1997),
Characterization of Embedded Multiconductor Transmission Lines, Tech. Dig., IEEE MTT-S International Microwave Symposium, Denver, CO
(Accessed May 9, 2025)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Characterization of Embedded Multiconductor Transmission Lines
Published
Author(s)
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
June 8-12, 1997
Conference Location
Denver, CO
Pub Type
Conferences
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 1, 1997, Updated February 19, 2017