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Characterization of Embedded Multiconductor Transmission Lines

Published

Author(s)

Dylan F. Williams
Proceedings Title
Tech. Dig., IEEE MTT-S International Microwave Symposium
Conference Dates
June 8-12, 1997
Conference Location
Denver, CO

Citation

Williams, D. (1997), Characterization of Embedded Multiconductor Transmission Lines, Tech. Dig., IEEE MTT-S International Microwave Symposium, Denver, CO (Accessed June 20, 2024)

Issues

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Created June 1, 1997, Updated February 19, 2017