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Displaying 251 - 275 of 299

Thermal Noise in Lossy Waveguides

July 1, 1996
Author(s)
Dylan F. Williams
This work rigorously treats thermal electromagnetic noise in lossy waveguides and develops explicit modal equivalent­ circuit representations for the noise generated by arbitrary passive networks embedded in them. The results show that the formulations in

On-Wafer Measurement at Millimeter Wave Frequencies

June 1, 1996
Author(s)
Dylan F. Williams, J. M. Belquin, G. Dambrine, R. Fenton
We investigate millimeter wave on-wafer calibration and measurement in coplanar waveguide and demonstrate the applicability of the multiline thru-reflect-line calibration and good measurement repeatability between laboratories. We also investigate

Line-Reflect-Match Calibrations with Nonideal Microstrip Standards

December 1, 1995
Author(s)
Dylan F. Williams, J. B. Schappacher
We apply a previously developed Line-Reflect-Match (LRM) calibration that compensates for the nonideal electrical behavior of the match standard to microstrip transmission lines and investigate impedance definitions, standard parasitics, and calibration

Coaxial Line-Reflect-Match Calibration

October 1, 1995
Author(s)
Jeffrey A. Jargon, Roger Marks, Dylan F. Williams
We describe a coaxial line-reflect-match calibration that corrects for imperfections in the load used as a match standard. The method provides a practical means of obtaining accurate, wideband calibrations with compact coaxial standard sets. When our load

LRM Probe-Tip Calibrations Using Nonideal Standards

February 1, 1995
Author(s)
Dylan F. Williams, Roger Marks
The line-reflect-match calibration is enhanced to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards using an additional line standard of moderate length

Compensation for Substrate Permittivity in Probe-Tip Calibration

December 1, 1994
Author(s)
Dylan F. Williams, Roger Marks
We demonstrate a method of compensation for the effect of substrate permittivity on coplanar waveguide probe-tip scattering parameter calibrations, modeling the effect as a capacitance at the probe tip. Comparison to on-wafer multiline TRL calibration

On-Wafer Impedance Measurement on Lossy Substrates

June 1, 1994
Author(s)
Dylan F. Williams, Roger Marks
This paper introduces a new method for measuring impedance parameters in transmission lines fabricated on lossy or dispersive dielectrics. The method, which uses an independent calibration to provide an impedance reference, compares well with conventional

LRM Probe-Tip Calibrations with Imperfect Resistors and Lossy Lines

December 1, 1993
Author(s)
Dylan F. Williams, Roger Marks
The line-reflect-match calibration is extended, without significant loss of measurement accuracy, to accommodate imperfect match standards and lossy lines typical of monolithic microwave integrated circuits. We characterize the match and line standards

Verification of Commercial Probe-Tip Calibrations

December 1, 1993
Author(s)
Roger Marks, Dylan F. Williams
We present results of a verification procedure useful in evaluating the accuracy of probe-tip scattering parameter measurements. The procedure was applied to calibrations and measurements performed in industrial laboratories. Actual measurement

Accurate Transmission Line Characterization

August 1, 1993
Author(s)
Dylan F. Williams, Roger Marks
This letter introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance

Reciprocity Relations in Waveguide Junctions

July 1, 1993
Author(s)
Dylan F. Williams, Roger Marks
The Lorentz reciprocity condition is applied to junctions composed of reciprocal media which connect uniform but otherwise arbitrary waveguides. An expression relating the forward and reverse transmission coefficients is derived and factored into two terms

Calibrating On-Wafer Probes to the Probe Tips

December 1, 1992
Author(s)
Dylan F. Williams, Roger Marks
This paper investigates the accuracy of on-wafer scattering-parameter calibrations at the probe tips. Data show the extent to which certain probe-tip calibrations are consistent with one another and applicable to the characterization of devices or circuits

Interconnection Transmission Line Parameter Characterization

December 1, 1992
Author(s)
Roger Marks, Dylan Williams
This paper introduces a new method for the characterization of transmission lines fabricated on lossy or dispersive dielectrics. The method, which is more accurate than conventional techniques, is used to examine the resistance, inductance, capacitance

Planar Resistors for Probe Station Calibration

December 1, 1992
Author(s)
Dave K. Walker, Dylan F. Williams, Nicole Morgan
This paper investigates the effects of variations in sheet resistance, geometry, distance from the probe tip, and fabrication processes on the impedance of planar nickel-chromium resistors. Resistor reactance is a strong function of film resistance, but

A General Waveguide Circuit Theory

October 1, 1992
Author(s)
Roger Marks, Dylan F. Williams
This work generalizes and extends the classical circuit theory of electromagnetic waveguides. Unlike the conventional theory, the present formulation applies to all waveguides composed of linear, isotropic material, even those involving lossy conductors

Wafer Probe Transducer Efficiency

October 1, 1992
Author(s)
Dylan F. Williams, Roger Marks, Dave K. Walker, Fred R. Clague
Experimental evidence is presented that shows the conventional expression relating the transducer efficiency of a two-port to measured scattering parameters is incorrect when the characteristic impedance at one of the ports is complex. This evidence is
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