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Displaying 276 - 299 of 299

Frequency-Dependent Transmission Line Parameters

April 1, 1992
Author(s)
Dylan F. Williams, Roger Marks
Recent theoretical developments have resulted in the rigorous definition of equivalent circuit parameters for non-TEM transmission lines. This summary provides a brief review of the theory and presents calculated and measured results illustrating the

Reciprocity Relations for On-Wafer Power Measurements

December 5, 1991
Author(s)
Roger Marks, Dylan F. Williams
The implications of expressions relating the forward and reverse transmission coefficients of a waveguide junction derived from the Lorentz reciprocity condition are explored. The two terms in the relation, the phase of the reference impedance in the guide

Benchmark for the Verification of Microwave CAD Software

December 1, 1991
Author(s)
R. Furlow, R. Y. Shimoda, Dylan Williams, Roger Marks, Kuldip Gupta
A set of microstrip structures which constitute a comprehensive benchmark for the verification of microwave Computer Aided Design (CAD) software has been developed in a collaborative effort. The benchmark is designed to exhibit a wide range of physical

Comparison of On-Wafer Calibrations

December 1, 1991
Author(s)
Dylan F. Williams, Roger Marks, A. Davidson
A powerful new verification technique determines the measurement accuracy of scattering parameter calibrations. The technique determines the relative reference impedance, reference plane offset, and the worst-case measurement deviations of any calibration

Transmission Line Capacitance Measurement

September 1, 1991
Author(s)
Dylan F. Williams, Roger Marks
The capacitance of coplanar lines is measured with two new techniques, one utilizing the resistance of the line and the other that of a resistor embedded in the line. The results of both measurements agree closely with calculations. A technique for

Anomalies Observed in Wafer Level Microwave Testing

July 10, 1991
Author(s)
Dylan F. Williams, Roger Marks, T H. Miers, A Cangellaris
Two anomalies have been observed in the course of developing planar wafer level standards for the testing of GaAs monolithic microwave integrated circuits. The first involves a low-frequency characteristic impedance change of microstrip and coplanar

MMIC Package Characterization with Active Loads

November 1, 1990
Author(s)
K. R. Phillips, Dylan Williams
Abstract: A technique for characterizing microwave packages based on active PIN diode standards is discussed. The technique allows packages to be accurately characterized from external reflection coefficient measurements when a single bias-dependent active

Progress Toward MMIC On-Wafer Standards

November 1, 1990
Author(s)
Dylan F. Williams, Roger Marks, K. R. Phillips, T. Miers
A prototype standard set in coplanar waveguide suitable for the calibration of wafer probe stations has been developed through a cooperative effort between the National Institute of Standards and Technology and a MIMIC Phase 3 team. The coplanar standard

The Interpretation and Use of S-Parameters in Lossy Lines

November 1, 1990
Author(s)
Dylan F. Williams, Roger Marks
Although a fundamental parameter of transmission lines, the characteristic impedance is difficult to measure accurately. We suggest a method by which it may be easily determined from a measurement of the propagation constant. The method is based on a

Damping of the Resonant Modes of a Rectangular Metal Package

January 1, 1989
Author(s)
Dylan F. Williams
When an electrical circuit is enclosed in a metal package large enough to support resonant modes within the frequencies of operation of the enclosed circuit, coupling between the circuit and these resonant cavity modes may disturb circuit operation. These

De-embedding Coplanar Probes with Planar Distributed Standards

December 1, 1988
Author(s)
Dylan F. Williams, Tom H. Miers
Two methods are used to de-embed coplanar probes using offset coplanar waveguide shorts and transmission lines. The accuracy of the de-embedded measurements is verified. The S parameters of lumped standards provided by the manufacturer of the probes are

A Coplanar Probe to Microstrip Transition

July 1, 1988
Author(s)
Dylan F. Williams, Tom H. Miers
A transition between a coplanar probe and a microstrip transmission line is reported. The transition is significant in that it does not require substrate via holes. A set of microstrip impedance standards were developed for the purpose of de-embedding the

Adjustable tuning for planar millimeter-wave circuits

August 12, 1986
Author(s)
Dylan F. Williams, S E. Schwarz, J. A. Sedlacek, D J. Ehrlich
At millimeter wavelengths uncontrollable parasitics are of ten large enough to significantly degrade circuit performance when they are not compensated by adjustable elements. It is difficult to add adjustable elements to planar millimeter-wave circuits

A planar subharmonically-pumped 71 GHz receiver with integral feed antenna

November 12, 1985
Author(s)
Dylan F. Williams, S E. Schwarz
A planar, subharmonically-pumped, hybrid millimeter-wave receiver with integral antenna is described. Coplanar waveguide filters are used to isolate the ports and provide image enhancement. The integral planar antenna has 12 dB gain and is suited for use

Design and Performance of Coplanar Waveguide Bandpass Filters

July 1, 1983
Author(s)
Dylan F. Williams, S E. Schwarz
End-coupled resonator bandpass filters built in coplanar waveguide are investigated. The admittance inverter parameters of the coupling gaps between resonant sections are deduced from experiment, and bandpass filter design rules are developed. This allows

Temperature variation of SAW power flow angle

February 19, 1981
Author(s)
Dylan F. Williams, F Y. Cho
The power flow angle of surface acoustic waves in quartz not on a crystalline axis of symmetry is shown to vary rapidly with temperature. Experimental results and theoretical calculations are presented demonstrating the dependence of the acoustic power

Numerical Analysis of Doubly Rotated Cut SAW Devices

April 30, 1980
Author(s)
Dylan Williams, F Y. Cho
Results of a numerical study of the properties of surface acoustic waves (SAW) on doubly rotated cuts of alpha quartz are presented. First and second order TCF's have been calculated on a 10° x 10° x 10° grid spanning the range of angles (XY wlt) 0 to 3O°/
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