Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Accurate experimental characterization of interconnects: a discussion of "Experimental electrical characterization of interconnects and discontinuities in high-speed digital systems"

Published

Author(s)

Roger Marks, Dylan F. Williams

Abstract

This paper discusses two issues concerning the accuracy or electrical characterizations of Interconnect transmission lines, particularly in regard to a recently published paper. The error in the characteristic impedance may be reduced through an alternative approximation to the capacitance of the transmission line. Furthermore, measurements or both the propagation constant and characteristic impedance, which are the two primary parameters characterizing the line, may be Improved by the use or a well-conditioned algorithm.
Proceedings Title
Proc., Intl. Symp on Microelectronics
Volume
15
Issue
4
Conference Dates
November 14-17, 1994
Conference Location
Boston, MA

Citation

Marks, R. and Williams, D. (1994), Accurate experimental characterization of interconnects: a discussion of "Experimental electrical characterization of interconnects and discontinuities in high-speed digital systems", Proc., Intl. Symp on Microelectronics, Boston, MA, [online], https://doi.org/10.1109/33.159892 (Accessed December 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 1994, Updated November 10, 2018