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Search Publications by: Dylan Williams (Fed)

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Displaying 201 - 225 of 583

A Prescription for Sub-Millimeter-Wave Transistor Characterization

July 1, 2013
Author(s)
Dylan F. Williams, Adam C. Young, Urteaga Miguel
We present an approach for characterizing transistors embedded in microstrip lines formed on a thin bisbenzocyclobutene-based (BCB) monomers film at sub-millimeter-wave frequencies. We demonstrate the approach to 750 GHz and estimate the uncertainty of the

Calibration-Kit Design for Millimeter-Wave Silicon Integrated Circuits

July 1, 2013
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Tai Wei, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
We study and present design guidelines for thru-reflect-line vector-network-analyzer calibration kits used for characterizing circuits and transistors fabricated on silicon integrated circuits at millimeter-wave frequencies. We compare contact-pad designs

The Impact of Characteristic Impedance on Waveform Calibrations

June 7, 2013
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale
We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of

The Impact of Characteristic Impedance on Waveform Calibrations

June 7, 2013
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Paul D. Hale
We examine the impact of the characteristic impedance on mismatch corrections for temporal waveform calibrations based on high-speed electro-optic sampling measurements. We show that failing to measure and account for the characteristic impedance of

A Precision Millimeter-Wave Modulated-Signal Source

June 6, 2013
Author(s)
Catherine A. Remley, Paul D. Hale, Dylan F. Williams, Chih-Ming Wang
We develop and characterize a modulated-signal source for use at millimeter-wave frequencies. Components within the source are phase locked by a 10 GHz reference source to minimize drift and improve synchronization. The complex frequency response of the

Sequential Estimation of Timebase Corrections for an Arbitrarily Long Waveform

October 1, 2012
Author(s)
Chih-Ming Wang, Paul D. Hale, Jeffrey A. Jargon, Dylan F. Williams, Catherine A. Remley
We present a procedure for correcting the timebase distortion and jitter of temporal waveforms of arbitrary lengths. This is achieved by estimating the timebase distortion and jitter sequentially with overlapping measurements and using the information in

Legendre Fit to the Reflection Coefficient of a Radiating Rectangular Waveguide Aperture

August 1, 2012
Author(s)
Dylan F. Williams, Mohammad T. Ghasr, Bradley K. Alpert, Zhongxiang Shen, Alexander Arsenovic, Robert M. Weikle, Reza Zoughi
We accurately calculate the reflection coefficient and normalized admittance of radiating open-ended rectangular waveguides and fit our results with a linear combination of Legendre polynomials. We verify the expression to an accuracy of 0.005 with other

Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

July 6, 2012
Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Chih-Ming Wang, Jeffrey A. Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States of America, the United Kingdom, and Germany offer measurement services based on electro-optic