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Search Publications by: Dylan Williams (Fed)

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Displaying 176 - 200 of 583

Rectangular-Waveguide Impedance

May 22, 2015
Author(s)
Dylan F. Williams, Jeffrey A. Jargon, Uwe Arz, Paul D. Hale
We discuss the role of the wave impedance in temporal measurements in rectangular waveguide and present a simple rule-of-thumb for estimating the difference of the temporal electric and magnetic field waveforms supported by the dominant TE10 mode. We also

Millimeter-Wave Modulated-Signal and Error-Vector-Magnitude Measurement With Uncertainty

May 1, 2015
Author(s)
Catherine A. Remley, Dylan F. Williams, Paul D. Hale, Chih-Ming Wang, Jeffrey A. Jargon, Youngcheol Park
We provide techniques to generate and characterize precision wideband millimeter-wave modulated signals. We use predistortion to obtain a significant improvement in signal quality and an associated reduction in the error vector magnitude (EVM) of the

A Compact Millimeter-wave Multisine Generator for Calibrating Broadband Vector Receivers

April 30, 2015
Author(s)
Paul D. Hale, Kate Remley, Dylan Williams, Jeffrey Jargon, Chih-Ming Wang
We propose a compact and low cost waveform source that can be used to calibrate the magnitude and phase response of vector receivers over a bandwidth as large as a few gigahertz. The generator consists of a broadband comb generator followed by a filter and

Parameter Estimation and Uncertainty Evaluation in a Low Rician K-Factor Reverberation-Chamber Environment

October 15, 2014
Author(s)
Chih-Ming Wang, Catherine A. Remley, Ansgar T. Kirk, Ryan J. Pirkl, Christopher L. Holloway, Dylan F. Williams, Paul D. Hale
In this paper we study statistical methods for estimating the Rician K-factor when this parameter is small. A fiducial approach for making statistical inference on the K-factor is discussed. The approach requires a Monte Carlo method to compute the

Crosstalk Corrections for Coplanar-Waveguide Scattering-Parameter Calibrations

August 1, 2014
Author(s)
Dylan F. Williams, Franz-Josef Schmuckle, Ralf Doerner, Phung N. Gia, Uwe Arz, Wolfgang Heinrich
We study crosstalk and crosstalk corrections in coplanar waveguide vector-network-analyzer calibrations. We show that while crosstalk corrections can improve measurement accuracy, the effectiveness of the corrections depends on a number of factors

Characterizing a Noninsertable Directional Device Using the NIST Uncertainty Framework

June 6, 2014
Author(s)
Jeffrey A. Jargon, Dylan F. Williams, Paul D. Hale, Michael D. Janezic
We characterize and provide uncertainties for a noninsertable, directional device over a frequency range of 90 to 100 GHz using the NIST Microwave Uncertainty Framework in conjunction with a commercial vector network analyzer. Our device consists of a

A Prescription for THz Transistor Characterization

April 4, 2014
Author(s)
Dylan F. Williams
Advances in microwave wafer probes and vector network analyzers have opened up a whole new world of discovery in microwave metrology, making possible accurate on-wafer measurements in printed transmission lines at microwave, millimeter-wave, sub-millimeter

Calibrations for Millimeter-Wave Silicon Transistor Characterization

March 1, 2014
Author(s)
Dylan F. Williams, Phillip Corson, Sharma Jahnavi, Krishnaswamy Harish, Wei Tai, George Zacharias, Ricketts David, Watson Paul, Dacquay Eric, Voinigescu Sorin
This paper compares on-wafer thru-reflect-line (TRL) and off-wafer short-open-load-thru (SOLT) and line-reflect-reflect-match (LRRM) vector-network-analyzer probe-tip calibrations for amplifier characterization and parasitic-extraction calibrations for