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Displaying 176 - 200 of 299

Extended NVNA Bandwidth for Long-Term Memory Measurements

June 11, 2004
Author(s)
Catherine A. Remley, Dominique Schreurs, Dylan F. Williams, John Wood
We present a new technique for measuring the magnitude and phase of intermodulation products outside the measurement bandwidth of our instrumentation. We apply the technique to measurements of long-term memory effects, and realte our measurements to

Vector Mixer Characterization for Image Mixers

January 1, 2004
Author(s)
Joel Dunsmore, Sean Hubert, Dylan Williams
The vector mixer characterization method first introduced by Dunsmore [1] can be used only for mixers where the Local Oscillator (LO) frequency lies between the RF input and output frequencies. Attempts to use the method for mixers with the LO greater than

An Optimal Vector-Network-Analyzer Calibration Algorithm

December 1, 2003
Author(s)
Dylan Williams, Chih-Ming Wang, Uwe Arz
We present an iterative algorithm for calibrating vector network analyzers based on orthogonal distance regression. The algorithm features a robust, yet efficient, search algorithm, a complete error analysis that includes both random and systematic errors

An Optimal Multiline TRL Calibration Algorithm

June 17, 2003
Author(s)
Dylan Williams, Jack Wang, Uwe Arz
We examine the performance of two on-wafer multiline TRL calibration algorithms, the popular multiline TRL algorithm implemented in the MultiCal software package and a newly implemented iterative algorithm designed to give optimal results in the presence

Sampling Oscilloscope Models and Calibrations

June 17, 2003
Author(s)
Kate Remley, Dylan Williams
We discuss the basic principles of operation of electrical sampling oscilloscopes and describe circuit models developed to design, characterize, and help explain their operation. We survey common oscilloscope calibration schemes that correct for finite

Phase Detrending for Measured Multisine Signals

June 13, 2003
Author(s)
Kate Remley, Dylan Williams, Dominique Schreurs, Giovanni Loglio, Cidronali Alessandro
We develop a method to detrend the phases of measured multisine signals. We find a time reference that removes the linear component of the measured phases and aligns them to their expected values to the precision specified by the user. An initial guess is

VNA Calibration Software Manual

June 1, 2003
Author(s)
Dylan Williams, Jack Wang, Uwe Arz
This software algorithm combines a decade of experience in applying orthogonal distance regression and other iterative techniques to solving vector-network-analyzer (VNA) calibrations. The new software features a robust algorithm capable of finding

Measuring the Invasiveness of High-Impedance Probes

May 14, 2003
Author(s)
Uwe Arz, Pavel Kabos, Dylan Williams
We use on-wafer measurements to characterize the invasiveness of high-impedance probes over a broad frequency range. We show that a two-port representation characterizing the invasiveness of the probe can also be determined from a calculation of the probe

Causal Characteristic Impedance of Planar Transmission Lines

May 1, 2003
Author(s)
Dylan F. Williams, Bradley K. Alpert, Uwe Arz, Hartmut Grabinski
Abstract: We compute power-voltage, power-current, and causal definitions of the characteristic impedance of microstrip and coplanar-waveguide transmission lines on insulating and conducting silicon substrates, and compare to measurement.

Calibrated Measurement of Optoelectronic Frequency Response

April 1, 2003
Author(s)
Paul D. Hale, Dylan Williams
We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.

Calibrated Waveform Measurement with High-Impedance Probes

February 1, 2003
Author(s)
Pavel Kabos, Howard C. Reader, Uwe Arz, Dylan Williams
We develop an on-wafer waveform calibration technique that combines frequency-domain mismatch corrections to account for the effects of the probe on the measurement with an oscilloscope calibration. The mismatch correction is general and can be applied to

Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques

January 1, 2003
Author(s)
M M. Maska, Jon Martens, Tracy S. Clement, Paul D. Hale, Dylan Williams
This paper discusses the typical uncertainties associated with characterizing high speed photodiodes to 65 GHz when using a vector network analyzer measurement technique. We analyzed the accuracy of the technique by comparing measurements of two reference

Permittivity Characterization of Low-k Thin films from Transmission-Line Measurements

January 1, 2003
Author(s)
Michael D. Janezic, Dylan Williams, V. Blaschke, A. Karamcheti, Fengbo Hang
We develop a broadband technique for measuring the permittivity of low-k thin films using microstrip transmission-line measurements. From measurements of the complex microstrip propagation constant and the characteristics impedance, we determine the

Calibrating Photoreceiver Response to 110 GHz

November 13, 2002
Author(s)
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.

Applications of Calibration Comparison in On-wafer Measurement

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams
In this paper we discuss several applications of calibration comparison in on-wafer measurement. This technique can be understood as an abstraction of the well-known two-tier deembedding scheme used in test-fixture characterization. The applications

Characteristic Impedance Measurement of Planar Transmission Lines

August 17, 2002
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
In this paper we investigate a simple, robust and general method to determine the characteristic impedance of planar transmission lines based on calibration comparison. We apply the method to different types of planar transmission lines like CPW and

Wideband Frequency-Domain Characterization of High-Impedance Probes

November 30, 2001
Author(s)
Uwe Arz, Howard C. Reader, Pavel Kabos, Dylan F. Williams
In this paper we investigate the broadband microwave properties of high-impedance probes designed for on-wafer waveform measurements. We show that the standard two-tier characterization method fails. We introduce two new methods of characterization, both

Transmission-line Parameter Approximation for Digital Simulation

November 1, 2001
Author(s)
Dylan Williams, Christopher L. Holloway
This paper compares closed-form approximations for coplanar waveguide and microstrip transmission-line parameters to accurate measurements and full-wave calculations. We suggest improved approximations and demonstrate the limitations of our proposed and

Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines

October 1, 2001
Author(s)
Uwe Arz, Dylan Williams, Hartmut Grabinski
We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study

Measuring the Frequency Response of Gigabit Chip Photodiodes

September 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams, E. Balta, N. D. Taneja
We describe a calibratin and measurement procedure for determining the intrinsic frequency response fo gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time-domain using a calibrated

Analytic Sampling-Circuit Model

June 1, 2001
Author(s)
Dylan F. Williams, Catherine A. Remley
Abstract: We develop analytic expressions for the impulse response and kickout pulses of a simple sampling circuit that incorporate the nonlinear junction capacitance of the sampling diode. We examine the effects of both the time-varying junction
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