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Extended NVNA Bandwidth for Long-Term Memory Measurements

Published

Author(s)

Catherine A. Remley, Dominique Schreurs, Dylan F. Williams, John Wood

Abstract

We present a new technique for measuring the magnitude and phase of intermodulation products outside the measurement bandwidth of our instrumentation. We apply the technique to measurements of long-term memory effects, and realte our measurements to frequency-dependent physical characteristics in the circuitry.
Proceedings Title
IEEE-MTT-S International Microwave Symposium Digest
Volume
3
Conference Dates
June 6-11, 2004
Conference Location
Fort Worth, TX
Conference Title
Dig. IEEE Microwave International Microwave Symposium Digest

Keywords

Intermodulation distortion, large-signal measurements, nonlinear vector network analyzer, long-term memory effect.

Citation

Remley, C. , Schreurs, D. , Williams, D. and Wood, J. (2004), Extended NVNA Bandwidth for Long-Term Memory Measurements, IEEE-MTT-S International Microwave Symposium Digest, Fort Worth, TX, [online], https://doi.org/10.1109/MWSYM.2004.1338931 (Accessed May 16, 2022)
Created June 11, 2004, Updated January 27, 2020