Extended NVNA Bandwidth for Long-Term Memory Measurements
Catherine A. Remley, Dominique Schreurs, Dylan F. Williams, John Wood
We present a new technique for measuring the magnitude and phase of intermodulation products outside the measurement bandwidth of our instrumentation. We apply the technique to measurements of long-term memory effects, and realte our measurements to frequency-dependent physical characteristics in the circuitry.
IEEE-MTT-S International Microwave Symposium Digest
June 6-11, 2004
Fort Worth, TX
Dig. IEEE Microwave International Microwave Symposium Digest
, Schreurs, D.
, Williams, D.
and Wood, J.
Extended NVNA Bandwidth for Long-Term Memory Measurements, IEEE-MTT-S International Microwave Symposium Digest, Fort Worth, TX, [online], https://doi.org/10.1109/MWSYM.2004.1338931
(Accessed May 16, 2022)