Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques

Published

January 1, 2003

Author(s)

M M. Maska, Jon Martens, Tracy S. Clement, Paul D. Hale, Dylan Williams

Abstract

This paper discusses the typical uncertainties associated with characterizing high speed photodiodes to 65 GHz when using a vector network analyzer measurement technique. We analyzed the accuracy of the technique by comparing measurements of two reference standards that had previously been calibrated using electro-optic sampling and heterodyne methods. The results of the comparison show very good correlation to the direct characterizations. Typical uncertainties were less than 1.0 dB at frequencies up to 50 GHz and less than 2 dB at 65 GHz. The dominant sources of uncertainty come from noise floor in the VNA above 50 GHz (depending upon signal level) and base uncertainty in the (E-O sampling) reference standard characterization.

Proceedings Title

Conf. Dig., 62nd Auto. RF Techniques Group

Conference Dates

December 2-5, 2003

Conference Location

Boulder, CO, USA

Pub Type

Conferences

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Keywords

calibration, electro-optic sampling, metrology, optoelectronic, VNA

Citation

Maska, M. , Martens, J. , Clement, T. , Hale, P. and Williams, D. (2003), Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques, Conf. Dig., 62nd Auto. RF Techniques Group, Boulder, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31523 (Accessed September 18, 2024)