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Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques

Published

Author(s)

M M. Maska, Jon Martens, Tracy S. Clement, Paul D. Hale, Dylan Williams

Abstract

This paper discusses the typical uncertainties associated with characterizing high speed photodiodes to 65 GHz when using a vector network analyzer measurement technique. We analyzed the accuracy of the technique by comparing measurements of two reference standards that had previously been calibrated using electro-optic sampling and heterodyne methods. The results of the comparison show very good correlation to the direct characterizations. Typical uncertainties were less than 1.0 dB at frequencies up to 50 GHz and less than 2 dB at 65 GHz. The dominant sources of uncertainty come from noise floor in the VNA above 50 GHz (depending upon signal level) and base uncertainty in the (E-O sampling) reference standard characterization.
Proceedings Title
Conf. Dig., 62nd Auto. RF Techniques Group
Conference Dates
December 2-5, 2003
Conference Location
Boulder, CO, USA

Keywords

calibration, electro-optic sampling, metrology, optoelectronic, VNA

Citation

Maska, M. , Martens, J. , Clement, T. , Hale, P. and Williams, D. (2003), Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques, Conf. Dig., 62nd Auto. RF Techniques Group, Boulder, CO, USA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31523 (Accessed February 27, 2024)
Created December 31, 2002, Updated October 12, 2021