A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design
Dominique Schreurs, Kate Remley, Dylan Williams
We propose a metric that quantifies the degree of nonlinearity of state-space trajectories. We use the metric to improve the selection of collections of measurements for the development of behavioral models. We illustrate the method with an off-the-shelf amplifier.
, Remley, K.
and Williams, D.
A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design, Dig., IEEE Microwave Theory Tech. Intl. Symp., Fort Worth, TX, USA, [online], https://doi.org/10.1109/MWSYM.2004.1339083, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31622
(Accessed May 22, 2022)