Schreurs, D.
, Remley, K.
and Williams, D.
(2004),
A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design, Dig., IEEE Microwave Theory Tech. Intl. Symp., Fort Worth, TX, USA, [online], https://doi.org/10.1109/MWSYM.2004.1339083, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31622
(Accessed September 20, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design
Published
Author(s)
Dominique Schreurs, ,
Abstract
We propose a metric that quantifies the degree of nonlinearity of state-space trajectories. We use the metric to improve the selection of collections of measurements for the development of behavioral models. We illustrate the method with an off-the-shelf amplifier.Proceedings Title
Dig., IEEE Microwave Theory Tech. Intl. Symp.
Volume
2
Conference Dates
June 6-11, 2004
Conference Location
Fort Worth, TX, USA
Conference Title
IEEE International Microwave Symposium
Pub Type
Conferences
Download Paper
Keywords
Behavioral model, large-signal measurements, metric, non-linearity, state-space trajectory
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created June 10, 2004, Updated October 12, 2021