Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design

Published

Author(s)

Dominique Schreurs, Kate Remley, Dylan Williams

Abstract

We propose a metric that quantifies the degree of nonlinearity of state-space trajectories. We use the metric to improve the selection of collections of measurements for the development of behavioral models. We illustrate the method with an off-the-shelf amplifier.
Proceedings Title
Dig., IEEE Microwave Theory Tech. Intl. Symp.
Volume
2
Conference Dates
June 6-11, 2004
Conference Location
Fort Worth, TX, USA
Conference Title
IEEE International Microwave Symposium

Keywords

Behavioral model, large-signal measurements, metric, non-linearity, state-space trajectory

Citation

Schreurs, D. , Remley, K. and Williams, D. (2004), A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design, Dig., IEEE Microwave Theory Tech. Intl. Symp., Fort Worth, TX, USA, [online], https://doi.org/10.1109/MWSYM.2004.1339083, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31622 (Accessed May 22, 2022)
Created June 10, 2004, Updated October 12, 2021