@conference{777956,
  author = {Dominique Schreurs and Kate Remley and Dylan Williams},
  title = {A Metric for Assessing the Degree of Device Nonlinearity and Improving Experimental Design},
  year = {2004},
  number = {2},
  month = {2004-06-11 00:06:00},
  publisher = {Dig., IEEE Microwave Theory Tech. Intl. Symp., Fort Worth, TX, USA},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=31622},
  doi = {https://doi.org/10.1109/MWSYM.2004.1339083},
  language = {en},
}