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Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines

Published

Author(s)

Uwe Arz, Dylan Williams, Hartmut Grabinski

Abstract

We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study illustrates the important role of the return path in determining the electromagnetic coupling between the lines.
Conference Dates
October 23-25, 2001
Conference Location
Boston, MA, USA
Conference Title
2001 Elect. Perform. of Electronic Pkg.

Keywords

asymmetric coupled lines, ground return path, on-wafer measurement

Citation

Arz, U. , Williams, D. and Grabinski, H. (2001), Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines, 2001 Elect. Perform. of Electronic Pkg., Boston, MA, USA (Accessed April 17, 2024)
Created October 1, 2001, Updated October 12, 2021