Arz, U.
, Williams, D.
and Grabinski, H.
(2001),
Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines, 2001 Elect. Perform. of Electronic Pkg., Boston, MA, USA
(Accessed December 5, 2024)
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Experimental Study of the Ground Plane in Asymmetric Coupled Silicon Lines
Published
Author(s)
, , Hartmut Grabinski
Abstract
We use a measurement method designed for coupled lines on highly conductive substrates to characterize identical asymmetric coupled lines fabricated on lossy silicon with and without a metalization plane beneath the two signal conductors. The study illustrates the important role of the return path in determining the electromagnetic coupling between the lines.Conference Dates
October 23-25, 2001
Conference Location
Boston, MA, USA
Conference Title
2001 Elect. Perform. of Electronic Pkg.
Pub Type
Conferences
Keywords
asymmetric coupled lines, ground return path, on-wafer measurement
Citation
Issues
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Created October 1, 2001, Updated October 12, 2021