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Nanotechnology

Nanometrology

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Displaying 726 - 750 of 866

Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy

February 12, 2010
Author(s)
Norman A. Sanford, Paul T. Blanchard, Kristine A. Bertness, Lorelle Mansfield, John B. Schlager, Aric W. Sanders, Alexana Roshko, Beau Burton, Steven George
Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficient for

Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering

January 18, 2010
Author(s)
Ward L. Johnson, Sudook A. Kim, Roy H. Geiss, Colm Flannery, Paul R. Heyliger, Christopher L. Soles, Wen-Li Wu, Chengqing C. Wang, Christopher M. Stafford, B D. Vogt
Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these

Nanoscale Measurements With the TSOM Optical Method

January 4, 2010
Author(s)
Ravikiran Attota
A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions will

Accurate optical analysis of single molecule entrapment in nanoscale vesicles

January 1, 2010
Author(s)
Joseph E. Reiner, Andreas Jahn, Samuel M. Stavis, Michael J. Culbertson, Wyatt N. Vreeland, Daniel L. Burden, Jon C. Geist, Michael Gaitan
We present a non-destructive method to characterize low analyte concentrations in nanometer scale lipid vesicle formulations. Our method is based on the application of fluorescence fluctuation analysis (FFA) and multi-angle laser light scattering (MALLS)

Traceability: The Key to Nanomanufacturing

December 30, 2009
Author(s)
Ndubuisi George Orji, Ronald G. Dixson, Bryan Barnes, Richard M. Silver
Over the last few years key advances have been made in the area of nanomanufacturing and nanofabrication. Several researchers have produced nanostructures using either top-down or bottom-up techniques, while other groups have functionalized such structures

Electrical Characterization of Soluble Anthradithiophene Derivatives

November 19, 2009
Author(s)
Brad Conrad, Calvin Chan, Marsha A. Loth, John E. Anthony, David J. Gundlach
Organic semiconductors remain an active subject for device physics and material science because of their varied electrical properties and potential for low-cost, high-throughput roll-to-roll processing. Several high-mobility oligomers, such as pentacene

Optical TSOM method for 3D interconnect metrology

November 18, 2009
Author(s)
Ravikiran Attota
There is a great need for high accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). In this presentation we propose evaluating the viability of the newly developed through

Fabrication with Flip-Chip Lamination

November 15, 2009
Author(s)
Mariona Coll Bau, Curt Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, Nanotechnology colloquium, Wake Forest University, 11-09.

A Benchmark Study on the Thermal Conductivity of Nanofluids

November 13, 2009
Author(s)
Jacopo Buongiorno, David Venerus, Naveen Prabhat, Thomas McKrell, Jessica Townsend, Rebecca Christianson, Yuriy Tolmachev, Pawel Keblinski, Lin-wen Hu, Jorge Alvarado, In Cheol Bang, Sandra Bishnoi, Marco Bonetti, Frank Botz, Anselmo Cecre, Yun Chang, Gang Chen, Haisheng Chen, Sung Jae Chung, Minking Chyu, Sarit Das, Roberto Di Paola, Yulong Ding, F. Dubois, Grzegorz Dzido, Jacob Eapen, Werner Escher, Denis Funfschilling, Quentin Galand, Jinwei Gao, Patricia Gharagozloo, Kenneth Goodson, Jorge Gustova Jin, Haiping Hong, Mark Horton, Carlo Iorio, Andrzej Jarzebski, Yiran Jiang, L.W. Jin, Stephan Kabelac, Aravind Kamath, Mark A. Kedzierski, Chongyoup Kim, Ji Hyun Kim, Sukwon Kim, Lim Geok Kieng, K Leong, Indranil Manna, Bruno Michel, Rui Ni, Hrishikesh Patel, John Philip, Dimos Poulikakos, Cecile Reynaud, Raffaele Savino, Pawan Singh, Pengxiang Song, T. Sundararajan, Elena Timofeeva, Todd Tritcak, A.N. Turanov, Stefan Van Vaerenbergh, Dongsheng Wen, Sanjeeva Witharana, Charles Chun Yang, W.-H. Yeh, Xiao-Zheng Zhao, Sheng-Qi Zhou
This article reports on the International Nanofluid Property Benchmark Exercise (INPBE) in which the thermal conductivity of identical samples of colloidal dispersions of nanoparticles, or nanofluids , was measured by over 30 organizations worldwide, using

Measurement of heat capacity and enthalpy of formation of Nickel Silicide using Nano-calorimetry

November 2, 2009
Author(s)
Ravi Kummamuru, Lito De La Rama, Liang Hu, Mark D. Vaudin, Mikhail Efremov, Martin L. Green, David A. LaVan, Leslie Allen
We present characterization of energetics of the reaction between nickel and silicon thin films using differential scanning nano-calorimetry (nano-DSC). For the first time, nano-DSC measurements up to 850 °C and of enthalpy of thin film reactions have been

Fabrication with Flip-Chip Lamination

October 15, 2009
Author(s)
Mariona Coll Bau, Curt Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.

Prototype Cantilevers for AFM Nanomechanical Property Measurement

October 2, 2009
Author(s)
Richard S. Gates, Mark Reitsma
Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and

Size Measurement of Nanoparticles using Atomic Force Microscopy

October 1, 2009
Author(s)
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and operation

First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials

September 19, 2009
Author(s)
Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A. Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
This report presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from academia, industry, government and non-profit organizations on some of the critical issues pertaining to the development of
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