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Nanotechnology

Nanometrology

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Displaying 726 - 750 of 855

Electrical Characterization of Soluble Anthradithiophene Derivatives

November 19, 2009
Author(s)
Brad Conrad, Calvin Chan, Marsha A. Loth, John E. Anthony, David J. Gundlach
Organic semiconductors remain an active subject for device physics and material science because of their varied electrical properties and potential for low-cost, high-throughput roll-to-roll processing. Several high-mobility oligomers, such as pentacene

Optical TSOM method for 3D interconnect metrology

November 18, 2009
Author(s)
Ravikiran Attota
There is a great need for high accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). In this presentation we propose evaluating the viability of the newly developed through

Fabrication with Flip-Chip Lamination

November 15, 2009
Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, Nanotechnology colloquium, Wake Forest University, 11-09.

A Benchmark Study on the Thermal Conductivity of Nanofluids

November 13, 2009
Author(s)
Jacopo Buongiorno, David Venerus, Naveen Prabhat, Thomas McKrell, Jessica Townsend, Rebecca Christianson, Yuriy Tolmachev, Pawel Keblinski, Lin-wen Hu, Jorge Alvarado, In Cheol Bang, Sandra Bishnoi, Marco Bonetti, Frank Botz, Anselmo Cecre, Yun Chang, Gang Chen, Haisheng Chen, Sung Jae Chung, Minking Chyu, Sarit Das, Roberto Di Paola, Yulong Ding, F. Dubois, Grzegorz Dzido, Jacob Eapen, Werner Escher, Denis Funfschilling, Quentin Galand, Jinwei Gao, Patricia Gharagozloo, Kenneth Goodson, Jorge Gustova Jin, Haiping Hong, Mark Horton, Carlo Iorio, Andrzej Jarzebski, Yiran Jiang, L.W. Jin, Stephan Kabelac, Aravind Kamath, Mark A. Kedzierski, Chongyoup Kim, Ji Hyun Kim, Sukwon Kim, Lim Geok Kieng, K Leong, Indranil Manna, Bruno Michel, Rui Ni, Hrishikesh Patel, John Philip, Dimos Poulikakos, Cecile Reynaud, Raffaele Savino, Pawan Singh, Pengxiang Song, T. Sundararajan, Elena Timofeeva, Todd Tritcak, A.N. Turanov, Stefan Van Vaerenbergh, Dongsheng Wen, Sanjeeva Witharana, Charles Chun Yang, W.-H. Yeh, Xiao-Zheng Zhao, Sheng-Qi Zhou
This article reports on the International Nanofluid Property Benchmark Exercise (INPBE) in which the thermal conductivity of identical samples of colloidal dispersions of nanoparticles, or nanofluids , was measured by over 30 organizations worldwide, using

Measurement of heat capacity and enthalpy of formation of Nickel Silicide using Nano-calorimetry

November 2, 2009
Author(s)
Ravi Kummamuru, Lito De La Rama, Liang Hu, Mark D. Vaudin, Mikhail Efremov, Martin L. Green, David A. LaVan, Leslie Allen
We present characterization of energetics of the reaction between nickel and silicon thin films using differential scanning nano-calorimetry (nano-DSC). For the first time, nano-DSC measurements up to 850 °C and of enthalpy of thin film reactions have been

Fabrication with Flip-Chip Lamination

October 15, 2009
Author(s)
Mariona Coll Bau, Curt A. Richter, Christina Hacker
Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.

Prototype Cantilevers for AFM Nanomechanical Property Measurement

October 2, 2009
Author(s)
Richard S. Gates, Mark Reitsma
Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and

Size Measurement of Nanoparticles using Atomic Force Microscopy

October 1, 2009
Author(s)
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and operation

First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials

September 19, 2009
Author(s)
Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A. Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
This report presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from academia, industry, government and non-profit organizations on some of the critical issues pertaining to the development of

Accurate Picoscale Forces for Insitu Calibration of AFM

September 3, 2009
Author(s)
Koo-Hyun Chung, Gordon A. Shaw, Jon R. Pratt
The force sensitivity of an atomic force microscope is calibrated directly using an in situ realization of primary electrostatic forces ranging from 320 pN to 3.3 nN with accuracy of a few percent. The absolute accuracy of a common atomic force microscope

193 nm Angle-Resolved Scatterfield Microscope for Semiconductor Metrology

August 24, 2009
Author(s)
Martin Y. Sohn, Richard Quintanilha, Bryan M. Barnes, Richard M. Silver
An angle-resolved scatterfield microscope (ARSM( feating 193 nm excimer laser light wa developed for measuring critical dimension (CD) and overlay of nanoscale targets as used in semiconductor metrology. The microscope is designed to have a wide and

Nanoscale Photoresponse in Blended Organic Photovoltaics

August 16, 2009
Author(s)
Behrang H. Hamadani, Suyong S. Jung, Nikolai B. Zhitenev
Organic solar cells, which have attracted considerable interest over the last few years as low-cost, simply-processed alternatives for harvesting the solar energy, have interesting nanoscale properties; a thorough understanding of which is currently

ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION

August 13, 2009
Author(s)
Vincent A. Hackley, Martin Fritts, James F. Kelly, Anil K. Patri, Alan F. Rawle
A two-day international workshop was convened recently in order to scope out and address the urgent need for standards to accurately characterize the physico-chemical and biological properties of engineered nanomaterials. These standards are needed by

Nanoscale Measurements with a Through-Focus Scanning-Optical-Microscope

July 15, 2009
Author(s)
Ravikiran Attota, Richard M. Silver, Thomas A. Germer
We present a novel optical technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope, by analyzing through-focus scanning-optical-microscope (TSOM) images obtained at different focus positions. In

Robust Volume Calculations of Tumors of Various Sizes

July 13, 2009
Author(s)
Adele P. Peskin, Karen Kafadar, A.M. Santos, Gillian Haemer
Many advances in medicine today require the accurate reading of computerized tomographic (CT) images of the body. Tumors in the lung, for example, are classified according to their detected growth, i.e. change in volume, over a period of time. CT data are

Fracture toughness measurement of thin nanoporous films on stiff substrates

June 15, 2009
Author(s)
Dylan Morris, Robert F. Cook
Nanoporous low-dielectric-constant films constitute a class of materials that are plagued by fracture concerns and are not amenable to traditional fracture toughness measurement techniques. An indentation fracture toughness measurement technique has been

Optimization of Accurate SEM Imaging by Use of Artificial Images

May 22, 2009
Author(s)
Petr Cizmar, Andras Vladar, Michael T. Postek
Today the vast majority of the scanning electron microscopes (SEMs) are incapable of taking repeatable and accurate images at high magnifications. Geometric distortions are common, so are drift, vibration, and problems related to disturbing electro
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