Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Asphaltene Adsorption onto Self-Assembled Monolayers of Alkyltrichlorosilanes of Varying Chain Length

Published

Author(s)

Daniel A. Fischer, Saloman Turgman-Cohen, P K. Kilpatrick, Jan Genzer

Abstract

The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (NC) has been studied by means of contact angle measurements, spectroscopic ellipsometry and NEXAFS spectroscopy. The extent of asphaltene adsorption was found to depend primarily on the ability of the SAM layer to shield the underlying silicon substrate from interacting with the asphaltenes present in solution. Specifically, asphaltene adsorption decreased with increasing SAM grafting density, SAM, (i.e., number of SAM molecules per unit area), or/and NC. The effect of solvent quality on the extent of asphaltene adsorption was gauged by adsorbing asphaltenes from toluene, 1-methylnaphthalene, tetralin, decalin and toluene/heptanes mixtures. The extent of asphaltene adsorption was found to increase proportionally with decreasing the Hildebrand solubility parameter of the solvent.
Citation
ACS Applied Materials and Interfaces
Volume
1
Issue
6

Keywords

Asphaltenes, self-assembled monolayers, alkyltrichlorosilanes, NEXAFS, ellipsometry, wettability

Citation

Fischer, D. , Turgman-Cohen, S. , Kilpatrick, P. and Genzer, J. (2009), Asphaltene Adsorption onto Self-Assembled Monolayers of Alkyltrichlorosilanes of Varying Chain Length, ACS Applied Materials and Interfaces, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=903788 (Accessed December 11, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created December 5, 2009, Updated February 19, 2017