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Prototype Cantilevers for AFM Nanomechanical Property Measurement

Published

Author(s)

Richard S. Gates, Mark Reitsma

Abstract

Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and precision measurement methods. The purpose of this project is to explore potential cantilever designs as calibration reference artifacts and probes for making precise nanomechanical property measurements.
Citation
Cornell Nanoscale Science and Technology Facility 2009-2010 Research Accomplishments

Keywords

Atomic Force Microscopy, Calibration, Cantilever, Friction

Citation

Gates, R. and Reitsma, M. (2009), Prototype Cantilevers for AFM Nanomechanical Property Measurement, Cornell Nanoscale Science and Technology Facility 2009-2010 Research Accomplishments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905855 (Accessed October 6, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 2, 2009, Updated February 19, 2017