Gates, R.
and Reitsma, M.
(2009),
Prototype Cantilevers for AFM Nanomechanical Property Measurement, Cornell Nanoscale Science and Technology Facility 2009-2010 Research Accomplishments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905855
(Accessed October 20, 2025)
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Prototype Cantilevers for AFM Nanomechanical Property Measurement
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Abstract
Atomic Force Microscopy (AFM) is a widely used technique for imaging surfaces and measuring properties at the micro and nano-scales; however, the accuracy and precision of these measurements is hampered by the lack of suitable traceable standards and precision measurement methods. The purpose of this project is to explore potential cantilever designs as calibration reference artifacts and probes for making precise nanomechanical property measurements.Citation
Cornell Nanoscale Science and Technology Facility 2009-2010 Research Accomplishments
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Others
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Keywords
Atomic Force Microscopy, Calibration, Cantilever, Friction
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Created October 2, 2009, Updated February 19, 2017