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Size Measurement of Nanoparticles using Atomic Force Microscopy

Published

Author(s)

Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook

Abstract

In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and operation to make such measurements are then discussed. Finally, the procedures for data analysis and reporting are provided. The example particles considered are National Institute of Standards and Technology (NIST) Au nanoparticle Reference Materials RM 8011 (nominally 10 nm particles), RM 8012 (30 nm), and RM 8013 (60 nm).
Citation
NCL Assay Cascade Protocols

Keywords

atomic force microscopy

Citation

Grobelny, J. , DelRio, F. , Namboodiri, P. , Kim, D. , Hackley, V. and Cook, R. (2009), Size Measurement of Nanoparticles using Atomic Force Microscopy, NCL Assay Cascade Protocols, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=854085 (Accessed June 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created September 30, 2009, Updated October 12, 2021