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Nanotechnology

Nanomaterials

News and Updates

Projects and Programs

Atomistic Potentials and the Future of Nanomaterials Metrology

Ongoing
Atomistic simulations are increasingly being used as a tool to understand and predict properties of materials in systems, such as nanomaterials, where direct measurement is time-consuming or extremely difficult. The success of atomistic simulations depends critically on the fidelity of a specific...

Publications

Software

Fluxon in Niobium at 4.5 K. The black contours represent the magnetic lines of force in this superconductor. Total phase shift corresponds to h/2e.

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

643 Axis Ultra DLD

X-ray Photoelectron Spectroscopy

The Material Measurement Science Division at NIST performs surface chemical analysis using X-ray Photoelectron Spectroscopy (XPS) with capabilities for routine

Awards

Headshot of Vincent A. Hackley, a man with short hair, glasses, and beard, smiling, wearing a suit and tie in front of a government building.

Vincent Hackley Honored by ASTM

In recognition of consistent dedication and outstanding service to ASTM Committee E56 on Nanotechnology since the committee’s inception in 2005.
Elijah Petersen with Mass Spectrometer

Elijah Petersen Honored with PECASE

For pioneering measurement methods of nanomaterials toxicity that now underpin industry and public sector assessments of the environmental, health, and safety impacts of technologically important products, such as carbon nanotubes.
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