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Nanotechnology

Nanomaterials

News and Updates

Events

Projects and Programs

Microplastic and Nanoplastic Metrology

Ongoing
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our
Three-dimensional view of carbon nanostructures grown on the surface of a glass fiber

Electron Microscopy of Carbon Nanotube Composites

Ongoing
Multi-wall CNTs (MWCNTs) are a common nano-carbon reinforcement material and are frequently dispersed into a polymer matrix to form composites that can be engineered with specific combinations of desirable properties – electrical, thermal, optical and mechanical, etc. However, this

Magnetic Nanostructures for post-CMOS Electronics

Completed
We focus primarily on arrays of magnetic nanostructures in order to reveal how defects alter the fundamental physics of magnetization reversal processes in the nanometer regime. We have an integrated approach that consists of four inter-related elements. The first element, film edge metrology

Publications

Software

Fluxon in Niobium at 4.5 K. The black contours represent the magnetic lines of force in this superconductor. Total phase shift corresponds to h/2e.

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Awards

Vincent Hackley smiling for the camera.

Vincent Hackley Honored by ASTM

In recognition of consistent dedication and outstanding service to ASTM Committee E56 on Nanotechnology since the committee’s inception in