Tools and Instruments

Displaying 1 - 6 of 6

Aberration-Corrected Transmission Electron Microscope (TEM)

Probe corrected 200kV analytic electron microscope Resolves single atoms Chemical analytic capability (EELS, EDS) Highest resolution in electron optics (<0.1 nm

Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM)

Dual beam focused ion beam/scanning electron microscope (FESEM). Focused ion beam using Ga atoms allows the patterning of objects at ~10 nm level (milling and

Local Electrode Atom Probe Tomography (LEAP)

Field evaporates (with a voltage and laser pulse) a sharp tip-shaped specimen. Collects the ionization products in a position-sensitive, time-of-flight mass

Material Analysis Using Neutron Depth Profiling

Light elements such as helium, lithium, boron, and nitrogen are essential constituents in materials that enable energy technologies; lithium ion batteries

NIST PTIR Instrumentation and Capabilities

Photothermal induced resonance (PTIR) combines the spatial resolution of atomic force microscopy (AFM) with the specificity of absorption spectroscopy

X-ray Photoelectron Spectroscopy

The Material Measurement Science Division at NIST performs surface chemical analysis using X-ray Photoelectron Spectroscopy (XPS) with capabilities for routine

Nanomaterials

Tools and Instruments