Nanomaterials

News and Updates

NIST, Collaborators Develop Sensitive New Way of Detecting Transistor Defects

October 7, 2021

Researchers at the National Institute of Standards and Technology (NIST) and collaborators have devised and tested a new, highly sensitive method of detecting

Ultracold transistors serve as their own memory devices

July 29, 2021

Digital transistors – assembled by the billions in today’s computer chips – act as near-perfect electronic switches. In the “on” position, achieved when an

NIST, Collaborators Develop New Method to Better Study Microscopic Plastics in the Ocean

May 20, 2021

If you’ve been to your local beach, you may have noticed the wind tossing around litter such as an empty potato chip bag or a plastic straw. These plastics

Projects and Programs

PTIR combines the spatial resolution of AFM with the specificity of absorption spectroscopy

Nano-Chemical Imaging and -Spectroscopy (IR, nIR, VIS)

Conventional techniques for analyzing chemical composition, such as infrared (IR) microscopy often miss critically important nanoscale details. To overcome this

Electron Microscopy of Carbon Nanotube Composites

Carbon nanomaterials such as carbon nanotubes (CNTs) and graphene have an extraordinary combination of mechanical, electronic and thermal properties that make

Carbon Nanotube Reference Materials

Single-wall carbon nanotubes are an important class of carbon nanomaterials with significant potential for commercial applications. The National Institute of

Pushing the Limits of Measurement Accuracy in Atom Probe Mass Spectrometry

Atom probe microscopy was developed over 50 years ago; however, only within the last 15 years has the technique begun to see widespread use, due to the

Publications

Imperfect Surface Order and Functionalization in Vertical Carbon Nanotube Arrays Probed by Near Edge X-ray Absorption Fine Structure Spectroscoy (NEXAFS)

October 12, 2021

Author(s)

T Hemraj-Benny, S Banerjee, S Sambasivan, Daniel A. Fischer, G Eres, Alexander Puretzky, David B. Geohegan, D H. Lowndes, J A. Misewich, S S. Wong

Probing surface order in nanotube systems is of fundamental importance for incorporation of these materials into practical electronic devices. The current study

Atomic Origin of the Autocatalytic Reduction of Monoclinic CuO in a Hydrogen Atmosphere

September 27, 2021

Author(s)

Xianhu Sun, Dongxiang Wu, Wenhui Zhu, Xiaobo Chen, Renu Sharma, Judith Yang, Guangwen Zhou

Reducibility is a prerequisite for the use of bulk metal oxides in chemical transformation 17 involving redox reactions but probing microscopic processes of

Nanopores in Atomically Thin 2D Nanosheets Limit Aqueous Single-Stranded DNA Transport

September 24, 2021

Author(s)

Alexander Smolyanitsky, Binquan Luan

Nanopores in 2D materials are highly desirable for DNA sequencing, yet achieving single-stranded DNA (ssDNA) transport through them is challenging. Using

Preparation, Characterization, and Biological Activity of Stability-Enhanced Polyethyleneimine-Conjugated Gold Nanoparticles (Au-PEI@NIST) for Biological Application

September 16, 2021

Author(s)

Tae Joon Cho, Vincent A. Hackley, Feng Yi, David A. LaVan, Vytas Reipa, Alessandro Tona, Bryant C. Nelson, Christopher Sims, Natalia Farkas

In this special publication, we report on a modified synthetic process that results in a stable suspension of Au-PEI nanoparticles, Au-PEI@NIST. Synthesized

Software

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM)

Dual beam focused ion beam/scanning electron microscope (FESEM). Focused ion beam using Ga atoms allows the patterning of objects at ~10 nm level (milling and

Local Electrode Atom Probe Tomography (LEAP)

Field evaporates (with a voltage and laser pulse) a sharp tip-shaped specimen. Collects the ionization products in a position-sensitive, time-of-flight mass

Aberration-Corrected Transmission Electron Microscope (TEM)

Probe corrected 200kV analytic electron microscope Resolves single atoms Chemical analytic capability (EELS, EDS) Highest resolution in electron optics (<0.1 nm

Raman facility

Raman scattering is a powerful light scattering technique used to diagnose the internal structure of molecules and crystals. In a light scattering experiment

Awards

Vincent Hackley Honored by ASTM

In recognition of consistent dedication and outstanding service to ASTM Committee E56 on Nanotechnology since the committee’s inception in

Elijah Petersen Honored with PECASE

For pioneering measurement methods of nanomaterials toxicity that now underpin industry and public sector assessments of the environmental