Nanomaterials

News and Updates

Superconducting Nanowire Single-Photon Detector

Unveiling the Universe: In 4 New Studies, NIST Explores Novel Ways to Hunt Dark Matter

December 8, 2022

For decades, astronomers and physicists have been trying to solve one of the deepest mysteries about the cosmos: An estimated 85% of its mass is missing.

nucleic acid nanotechnology illustration

A Revolution Still in the Making: NIST Researchers Chart the Future of Nucleic Acid Nanotechnology

October 27, 2022

Trapped in a microscopic cage made of strands of DNA, molecules of a life-saving drug course through the bloodstream of a cancer patient. Only when receptors on

No Fib: NIST Unmasks a Superfast Process for Nanoscale Machining

August 23, 2022

Cutting intricate patterns as small as several billionths of a meter deep and wide, the focused ion beam (FIB) is an essential tool for deconstructing and

Projects and Programs

Microplastic and Nanoplastic Metrology

Ongoing

The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with

PTIR combines the spatial resolution of AFM with the specificity of absorption spectroscopy

Nano-Chemical Imaging and -Spectroscopy (IR, nIR, VIS)

Ongoing

Conventional techniques for analyzing chemical composition, such as infrared (IR) microscopy often miss critically important nanoscale details. To overcome this

Chemical Characterization of Nanoparticles

Ongoing

The Chemical Sciences Division is helping to support nanotechnology research being conducted throughout NIST by developing and applying methods for the chemical

Structure, Defects, and Scattering in Graphene

Ongoing

Since its discovery, graphene, a single atomic sheet of carbon atoms, has become a leading contender to be a key building-block material for future generations

Publications

Tip-enhanced Raman scattering for atomic-scale spectroscopy and imaging

October 24, 2022

Author(s)

Jeremy Schultz

Atomic scale spectroscopy provides an exceptional ability to define electronic, optical, thermal, mechanical, and chemical properties of materials at the

Accurate Nanoparticle Size Determination using Electrical Mobility Measurements in the Step and Scan Modes

October 12, 2022

Author(s)

Kaleb Duelge, George Mulholland, Vincent A. Hackley, Michael Zachariah

A critical and extensive comparison was made between differential mobility analysis (DMA) measurements of the mean diameter of monodisperse gold nanoparticles

Adlayer formation on C-plane (0001) and R-plane (1-102) Al2O3 surfaces

October 5, 2022

Author(s)

Aaron Johnston-Peck, Russell Maier

Analysis of Nano-Objects using Field Flow Fractionation - Interlaboratory Comparison Protocol – Centrifugal Field Flow Fractionation

August 12, 2022

Author(s)

Vincent A. Hackley, Haruhisa Kato

This document contains information necessary to perform measurements and report results as a participant in the interlaboratory comparison for ISO Technical

Software

HolograFREE

An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines

Tools and Instruments

Raman facility

Raman scattering is a powerful light scattering technique used to diagnose the internal structure of molecules and crystals. In a light scattering experiment

Dual Beam Focused Ion Beam / Scanning Electron Microscope (FIB/SEM)

Dual beam focused ion beam/scanning electron microscope (FESEM). Focused ion beam using Ga atoms allows the patterning of objects at ~10 nm level (milling and

Local Electrode Atom Probe Tomography (LEAP)

Field evaporates (with a voltage and laser pulse) a sharp tip-shaped specimen. Collects the ionization products in a position-sensitive, time-of-flight mass

Aberration-Corrected Transmission Electron Microscope (TEM)

Probe corrected 200kV analytic electron microscope Resolves single atoms Chemical analytic capability (EELS, EDS) Highest resolution in electron optics (<0.1 nm

Awards

Vincent Hackley Honored by ASTM

In recognition of consistent dedication and outstanding service to ASTM Committee E56 on Nanotechnology since the committee’s inception in

Elijah Petersen Honored with PECASE

For pioneering measurement methods of nanomaterials toxicity that now underpin industry and public sector assessments of the environmental