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For decades, astronomers and physicists have been trying to solve one of the deepest mysteries about the cosmos: An estimated 85% of its mass is missing.
Trapped in a microscopic cage made of strands of DNA, molecules of a life-saving drug course through the bloodstream of a cancer patient. Only when receptors on
Cutting intricate patterns as small as several billionths of a meter deep and wide, the focused ion beam (FIB) is an essential tool for deconstructing and
The mission of the Micro and Nanoplastic (MNP) Metrology Project is to assist regulators in assessing the human health and environmental risks associated with
Conventional techniques for analyzing chemical composition, such as infrared (IR) microscopy often miss critically important nanoscale details. To overcome this
Over the past decade nanoscale science has produced varied and fascinating nanostructures with an extraordinary range of interesting and useful properties. In
Our goal is to address the metrology of magnetic effects at the nanoscale level. Nanomagnet arrays form the basis for major data storage technologies, notably
Atomic scale spectroscopy provides an exceptional ability to define electronic, optical, thermal, mechanical, and chemical properties of materials at the
Kaleb Duelge, George Mulholland, Vincent A. Hackley, Michael Zachariah
A critical and extensive comparison was made between differential mobility analysis (DMA) measurements of the mean diameter of monodisperse gold nanoparticles
This document contains information necessary to perform measurements and report results as a participant in the interlaboratory comparison for ISO Technical
An electron hologram is a fringe modulated image containing the amplitude and phase information of an electron transparent object. The HolograFREE routines
Raman scattering is a powerful light scattering technique used to diagnose the internal structure of molecules and crystals. In a light scattering experiment
Dual beam focused ion beam/scanning electron microscope (FESEM). Focused ion beam using Ga atoms allows the patterning of objects at ~10 nm level (milling and
Field evaporates (with a voltage and laser pulse) a sharp tip-shaped specimen. Collects the ionization products in a position-sensitive, time-of-flight mass
Probe corrected 200kV analytic electron microscope Resolves single atoms Chemical analytic capability (EELS, EDS) Highest resolution in electron optics (<0.1 nm