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Local Electrode Atom Probe Tomography (LEAP)

Local Electrode Atom Probe Tomography (LEAP)
  • Field evaporates (with a voltage and laser pulse) a sharp tip-shaped specimen. Collects the ionization products in a position-sensitive, time-of-flight mass spectrometer 
  • Can determine the atomic species with ppm sensitivity and position from within the original analysis volume with sub-nm accuracy
  • Manufacturer/Model: Cameca LEAP 4000x Si

Research Highlights:

Laser-assisted atom probe tomography of weld region showing high-carbon interlath material with an isoconcentration surface of nominally 0.8 at. % embedded in martensite steel.  Image shows a tip from two viewpoints that is mostly interlath material.
Credit: Paul Blanchard and Ann Chiaramonti Debay
Laser-assisted atom probe tomography of weld region showing high-carbon interlath material with an isoconcentration surface of nominally 0.8 at. % embedded in martensite steel.

Laser-assisted atom probe tomography of InGaN quantum wells in a GaN nanowire grown by molecular beam epitaxy.  Reconstruction with an isoconcentration surface of nominally 0.8 at. % indium is shown.
Credit: Norman Sanford
Laser-assisted atom probe tomography of InGaN quantum wells in a GaN nanowire grown by molecular beam epitaxy.  Reconstruction with an isoconcentration surface of nominally 0.8 at. % indium is shown.

 

Created June 8, 2016, Updated November 15, 2019