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Learning Atom Probe Tomography time-of-flight peaks for mass-to-charge ratio spectrometry
Published
Author(s)
Kevin J. Coakley, Norman A. Sanford
Abstract
In laser-assisted atom probe tomography, an important goal is to reconstruct the mass-to-charge ratio, (m/z), spectrum due to various ion species. In general, the probability mass function (pmf) associated with the time-of- flight (TOF) spectrum produced by each ion species is unknown and varies from species-to-species. Moreover, measuring pmfs for distinct ion species in calibration experiments is not practical. Here, we present a mixture model method to determine TOF pmfs that can vary from peak-to-peak. In this approach, we determine weights of candidate pmfs with a maximum likelihood method. In a proof-of-principle study, we apply our method to a TOF spectrum acquired from a silicon sample and determine intensity estimates of singly charged isotopes of silicon.
Coakley, K.
and Sanford, N.
(2022),
Learning Atom Probe Tomography time-of-flight peaks for mass-to-charge ratio spectrometry, Ultramicroscopy, [online], https://doi.org/10.1016/j.ultramic.2022.113521, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=933749
(Accessed October 10, 2025)