Research Interests: Materials characterization, electron- and ion-based microscopy, interfaces in metal alloys and multilayer thin films, metal/oxide heterostructures, transition metal oxide surface science, complex laser-matter interactions, high-field nanoscience, atom probe tomography, in-situ transmission electron microscopy.
Professional Affiliations: International Field Emission Society (IFES), Microscopy Society of America (MSA), Microanalysis Society (MAS), American Physical Society (APS), Materials Research Society (MRS), American Vacuum Society (AVS).
Imaging Spectrometer
NIST INVENTORS: NORMAN A. SANFORD and ANN CHIARAMONTI DEBAY
U.S. Patent Number 10153144.
Hybrid Extreme Ultraviolet Imaging Spectrometer
NIST INVENTORS: NORMAN A. SANFORD and ANN CHIARAMONTI DEBAY
U.S. Patent Number 9899197.