Ann Chiaramonti Debay

Materials Research Engineer
Ann Chiaramonti Debay
Materials Research Engineer
Nanoscale Reliability Group
chiaramonti@nist.gov
(303) 497-5701

Employment

(2013-Present) Materials Research Engineer. Applied Chemicals & Materials Division, NIST.
Boulder, CO

(2009-2013) NIST-ARRA Measurement Science & Engineering Fellow (Senior Scientist). NIST & University of Colorado Boulder.
Boulder, CO

(2005-2008) Post-Doctoral Research Associate. Interfacial Materials Group, Materials Science Division, Argonne National Laboratory.
Advisor: Amanda K. Petford-Long.
Argonne, IL

Industry Experience:
(2000) Process Engineer Co-Op. Thin Films/Diffusion Group, Intel Corporation.
Ocotillo, AZ

(1999) Process Engineer Intern. DUV Lithography Group, Intel Corporation.
Aloha, OR

(1997, 1998) Manufacturing Engineering Intern. Joining Development Group, General Motors Corporation.
Warren, MI

Education

(2005) Ph.D., Materials Science & Engineering. Northwestern University, Evanston, IL. 
Advisors: Laurence D. Marks (MS&E) and Peter C. Stair (Chemistry).
Minor: Applied Mathematics 
Magna Cum Laude 

(1999) B.S.E., Materials Science & Engineering. University of Michigan, Ann Arbor, MI. 
Magna Cum Laude

Research Interests: Interfaces in metal alloys and multilayer thin films, metal/oxide heterostructures, transition metal oxide surface science, complex laser-matter interactions, atom probe tomography, in-situ transmission electron microscopy.

Professional Affiliations: Microscopy Society of America (MSA), Microanalysis Society (MAS), International Field Emission Society (IFES), American Physical Society (APS), Materials Research Society (MRS), American Vacuum Society (AVS). 

Awards

  • Innovations in Measurement Science Award, NIST (2016)
  • National Academy of Engineering U.S. Frontiers of Engineering Fellowship (2015)
  • Distinguished Associate Award for Technical Achievement, NIST (2013)
  • NIST-ARRA Measurement Science and Engineering Fellowship, University of Colorado Boulder and NIST (2011-2012)
  • Outstanding Presentation Award, U.S. Department of Commerce Boulder Laboratories Annual Post-Doctoral Poster Symposium (2010 & 2011)
  • Top 10 Most Downloaded Articles of 2008, Transmission Electron Microscopy of Multilayer Thin Films, Annual Review of Materials Research (2008)
  • National Research Council Research Associateship Program Postdoctoral Fellowship (2005)
  • Best Oral Presentation, J.E. Hilliard Symposium, Department of Materials Science & Engineering, Northwestern University (2005)
  • Poster Award Winner, Fall Meeting of the Materials Research Society (2004)
  • BP Chemicals Graduate Student Award for Excellence in Environmental Molecular Science (2004)
  • Walter P. Murphy Graduate Fellowship, Northwestern University (2000)
  • Anvil Award for Outstanding Contributions to the Department of Materials Science and Engineering, University of Michigan (1999)
  • Best Poster, Undergraduate Summer Institute, Laurence Livermore National Laboratory (1998)
  • Intel Foundation Women in Science and Engineering Fellowship, University of Michigan (1997-1999)

Publications

Atom Probe Tomography Analysis of the Reference Zircon GJ-1: A Round-Robin Experiment

September 20, 2018
Author(s):
Ann C. Chiaramonti Debay, Paul T. Blanchard, Alexandre La Fontaine, Florent Exertier, Sandra Piazolo, Elena Belousova, Zirong Peng, Baptiste Gault, David W. Saxey, Denis Fougerouse, Steven Reddy, Julie Cairney
In recent years, atom probe tomography (APT) has been increasingly used to study minerals, and in particular Zircons. The mineral Zircon (ZrSiO4) is ideally...
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Created October 09, 2019