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Ann Chiaramonti Debay (Fed)

Materials Research Engineer

Research Interests: Interfaces in metal alloys and multilayer thin films, metal/oxide heterostructures, transition metal oxide surface science, complex laser-matter interactions, atom probe tomography, in-situ transmission electron microscopy.

Professional Affiliations: Microscopy Society of America (MSA), Microanalysis Society (MAS), International Field Emission Society (IFES), American Physical Society (APS), Materials Research Society (MRS), American Vacuum Society (AVS). 


  • Innovations in Measurement Science Award, NIST (2016)
  • National Academy of Engineering U.S. Frontiers of Engineering Fellowship (2015)
  • Distinguished Associate Award for Technical Achievement, NIST (2013)
  • NIST-ARRA Measurement Science and Engineering Fellowship, University of Colorado Boulder and NIST (2011-2012)
  • Outstanding Presentation Award, U.S. Department of Commerce Boulder Laboratories Annual Post-Doctoral Poster Symposium (2010 & 2011)
  • Top 10 Most Downloaded Articles of 2008, Transmission Electron Microscopy of Multilayer Thin Films, Annual Review of Materials Research (2008)
  • National Research Council Research Associateship Program Postdoctoral Fellowship (2005)
  • Best Oral Presentation, J.E. Hilliard Symposium, Department of Materials Science & Engineering, Northwestern University (2005)
  • Poster Award Winner, Fall Meeting of the Materials Research Society (2004)
  • BP Chemicals Graduate Student Award for Excellence in Environmental Molecular Science (2004)
  • Walter P. Murphy Graduate Fellowship, Northwestern University (2000)
  • Anvil Award for Outstanding Contributions to the Department of Materials Science and Engineering, University of Michigan (1999)
  • Best Poster, Undergraduate Summer Institute, Laurence Livermore National Laboratory (1998)
  • Intel Foundation Women in Science and Engineering Fellowship, University of Michigan (1997-1999)


Atom probe tomography

Ann Chiaramonti Debay, Baptiste Gault, Julie Cairney, Michael P. Moody, Oana Cojocaru-Miredin, Patrick Stender, Renelle Dubosq, Christoph Freysoldt, Surendra Kumar Makineni, Tong Li
Atom probe tomography (APT) provides three-dimensional compositional mapping with sub-nanometre resolution. The sensitivity of APT is in the range of parts per

Towards data-driven next-generation transmission electron microscopy

Steven R. Spurgeon, Colin Ophus, Lewys Jones, Amanda K. Petford-Long, Sergei Kalinin, Matthew J. Olszta, Rafal Dunin-Borkowski, Norman Salmon, Khalid Hattar, Wei-Chang Yang, Renu Sharma, Yingge Du, Ann Chiaramonti Debay, Haimei Zheng, Edgar C. Buck, Libor Kovarik, R. Lee Penn, Dongsheng Li, Xin Zhang, Mitsuhiro Murayama, Mitra D. Taheri
The rapidly evolving field of electron microscopy touches nearly every aspect of modern life, underpinning impactful materials discoveries in applications such
Created October 9, 2019, Updated July 11, 2022