Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Ann Chiaramonti Debay (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 1 - 25 of 52

Atom Probe Tomography Using an Extreme Ultraviolet Trigger Pulse

September 1, 2023
Author(s)
Benjamin Caplins, Ann Chiaramonti Debay, Jacob Garcia, Norman A. Sanford, Luis Miaja Avila
Atom probe tomography (APT) is a powerful materials characterization technique capable of measuring the isotopically resolved three-dimensional (3D) structure of nanoscale specimens with atomic resolution. Modern APT instrumentation most often uses an

Atom probe tomography

July 22, 2021
Author(s)
Ann Chiaramonti Debay, Baptiste Gault, Julie Cairney, Michael P. Moody, Oana Cojocaru-Miredin, Patrick Stender, Renelle Dubosq, Christoph Freysoldt, Surendra Kumar Makineni, Tong Li
Atom probe tomography (APT) provides three-dimensional compositional mapping with sub-nanometre resolution. The sensitivity of APT is in the range of parts per million for all elements, including light elements such as hydrogen, carbon or lithium, enabling

Comparative Apex Electrostatics of Atom Probe Tomography Specimens

April 28, 2021
Author(s)
Qihua Zhang, B. Klein, Norman A. Sanford, Ann Chiaramonti Debay
Laser-assisted atom probe tomography (APT) is the only known analytical method that can simultaneously provide sub-nm 3D spatial resolution and quantitative sensitivity approaching 1 ppm. APT has been applied with great success to the analysis of metals

Optical Scattering Characteristics of 3D Lunar Regolith Particles Measured using X-Ray Nano Computed Tomography

April 27, 2021
Author(s)
Edward Garboczi, Ann Chiaramonti Debay, Somen Baidya, Ahmed M. Hassan, Andrew Sharits, Jay D. Goguen, Thomas Lafarge, Mikolas Melius
Shape is a critical property, besides size and material composition, which has a strong effect on the optical scattering characteristics of a particle. In this work, we computationally study how the measured three-dimensional shapes of lunar regolith

Towards data-driven next-generation transmission electron microscopy

October 26, 2020
Author(s)
Steven R. Spurgeon, Colin Ophus, Lewys Jones, Amanda K. Petford-Long, Sergei Kalinin, Matthew J. Olszta, Rafal Dunin-Borkowski, Norman Salmon, Khalid Hattar, Wei-Chang Yang, Renu Sharma, Yingge Du, Ann Chiaramonti Debay, Haimei Zheng, Edgar C. Buck, Libor Kovarik, R. Lee Penn, Dongsheng Li, Xin Zhang, Mitsuhiro Murayama, Mitra D. Taheri
The rapidly evolving field of electron microscopy touches nearly every aspect of modern life, underpinning impactful materials discoveries in applications such as quantum information science, energy, and medicine. As the field enters a new decade, a

An Algorithm for Correcting Systematic Energy Deficits in the Atom Probe Mass Spectra of Insulating Samples

April 15, 2020
Author(s)
Benjamin W. Caplins, Paul T. Blanchard, Ann C. Chiaramonti Debay, David R. Diercks, Luis Miaja Avila, Norman A. Sanford
Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here we describe a post-processing technique developed to increase the quality of mass spectra of strongly insulating

Atom Probe Tomography using Extreme-Ultraviolet Light

March 27, 2020
Author(s)
Luis Miaja Avila, Ann C. Chiaramonti Debay, Benjamin W. Caplins, David R. Diercks, Brian Gorman, Norman A. Sanford
We present a different approach to laser-assisted atom probe tomography, where instead of using a near-UV laser for inducing a thermal transient, we use an extreme-ultraviolet coherent light source to trigger eld ion emission at the tip's apex. The use of

Field Ion Emission in an Atom Probe Microscope Triggered by Femtosecond-Pulsed Coherent Extreme Ultraviolet Light

March 12, 2020
Author(s)
Ann C. Chiaramonti Debay, Luis Miaja Avila, Benjamin W. Caplins, Paul T. Blanchard, Norman A. Sanford, Brian Gorman, David R. Diercks
This paper reports construction of an extreme ultraviolet (EUV) radiation-triggered atom probe tomograph and describes the results from initial experiments on amorphous SiO2. Femtosecond-pulsed coherent EUV radiation of 29.6 nm wavelength (41.85 eV photon

An Atom Probe Tomograph Incorporating a Wavelength-Tuneable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source

June 19, 2019
Author(s)
Ann C. Chiaramonti Debay, Luis Miaja Avila, Paul T. Blanchard, David R. Diercks, Brian Gorman, Norman A. Sanford
Pulsed coherent extreme ultraviolet (EUV) radiation is a potential promising alternative to pulsed infra-red, visible, and near- ultraviolet laser sources for atom probe tomography. In addition to having the benefit of high absorption across the periodic

Atom Probe Tomography Analysis of the Reference Zircon GJ-1: A Round-Robin Experiment

September 20, 2018
Author(s)
Ann C. Chiaramonti Debay, Paul T. Blanchard, Alexandre La Fontaine, Florent Exertier, Sandra Piazolo, Elena Belousova, Zirong Peng, Baptiste Gault, David W. Saxey, Denis Fougerouse, Steven Reddy, Julie Cairney
In recent years, atom probe tomography (APT) has been increasingly used to study minerals, and in particular Zircons. The mineral Zircon (ZrSiO4) is ideally suited for geochronology by utilising the U-Th-Pb isotope systems, and trace element compositions

Experimental scattering matrix for lunar regolith simulant JSC-1A at visible wavelengths

March 8, 2018
Author(s)
Edward J. Garboczi, Ann C. Chiaramonti Debay, Thomas V. Lafarge, O Munoz, J Escobar-Cerezo, D Guirado, JC Gomez-Martin, Jay Goguen, F Moreno
We present the experimental scattering matrix as a function of the scattering angle of the lunar soil simulant JSC-1A. The measurements were performed at 488 nm, 520 nm and 647 nm, covering the range of scattering angles from 3o to 177o. The size

A workshop report on “Electron Microscopy Frontiers: Challenges and Opportunities”

December 21, 2017
Author(s)
June W. Lau, John E. Bonevich, Andrew A. Herzing, Ann C. Chiaramonti Debay, Robert R. Keller
For two days beginning on March 8, 2017, a planning workshop entitled “Electron Microscopy Frontiers: Opportunities and Challenges” was hosted by the Material Measurement Laboratory (MML) of the National Institute of Standards and Technology (NIST). Grass

Introducing a New NIST Reference Material: Multiwall Carbon Nanotube Soot

July 25, 2016
Author(s)
Ann C. Chiaramonti Debay, Ryan M. White, Jason D. Holm, Elisabeth Mansfield
Multi-walled carbon nanotubes (MWCNTs) play a significant role in the nascent nanotechnology industry, due to their remarkable combination of mechanical, thermal, and electrical properties. These materials are specialty additives, reinforcing a diverse

Behavior of molecules and molecular ions near a field emitter

March 18, 2016
Author(s)
Ann C. Chiaramonti Debay, Baptiste Gault, Michael Ashton, Susan B. Sinnott, Michael P. Moody, David W. Saxey, D. K. Schreiber
The cold emission of particles from surfaces under intense electric fields is a process which underpins a variety of applications including atom probe tomography (APT), an analytical microscopy technique with near-atomic spatial resolution. Increasingly