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Advanced Characterization of Materials using Atom Probe Tomography

Published

Author(s)

Jacob Garcia, Ann Chiaramonti Debay

Abstract

No abstract required for this submission
Citation
Electronic Device Failure Analysis magazine
Volume
26
Issue
1

Citation

Garcia, J. and Chiaramonti Debay, A. (2024), Advanced Characterization of Materials using Atom Probe Tomography, Electronic Device Failure Analysis magazine, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936728 (Accessed April 23, 2024)
Created February 1, 2024, Updated February 12, 2024