Skip to main content
U.S. flag

An official website of the United States government

Dot gov

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Https

Secure .gov websites use HTTPS
A lock ( ) or https:// means you've safely connected to the .gov website. Share sensitive information only on official, secure websites.

An Algorithm for Correcting Systematic Energy Deficits in the Atom Probe Mass Spectra of Insulating Samples

Published

Author(s)

Benjamin W. Caplins, Paul T. Blanchard, Ann C. Chiaramonti Debay, David R. Diercks, Luis Miaja Avila, Norman A. Sanford

Abstract

Improvements in the mass resolution of a mass spectrometer directly correlate to improvements in peak identification and quantification. Here we describe a post-processing technique developed to increase the quality of mass spectra of strongly insulating samples in laser- pulsed atom probe. The technique leverages the self-similarity of atom probe mass spectra collected at different times during an experimental run to correct for electrostatic artifacts that present as systematic energy deficits. We demonstrate the method on fused silica and neodymium-doped ceria samples which highlight the improvements that can be made to the mass spectrum of strongly insulating samples.
Citation
Ultramicroscopy

Keywords

atom probe microscopy, field ion microscopy, insulators, computational methods

Citation

Caplins, B. , Blanchard, P. , Chiaramonti, A. , Diercks, D. , Miaja, L. and Sanford, N. (2020), An Algorithm for Correcting Systematic Energy Deficits in the Atom Probe Mass Spectra of Insulating Samples, Ultramicroscopy, [online], https://doi.org/10.1016/j.ultramic.2020.112995 (Accessed April 11, 2021)
Created April 15, 2020, Updated May 11, 2020