NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

PUBLICATIONS

Correcting Systematic Energy Deficits in the Laser-Pulsed Atom Probe Mass Spectrum of SiO2

Published

Author(s)

Benjamin W. Caplins, Paul T. Blanchard, Ann C. Chiaramonti Debay, David R. Diercks, Luis Miaja Avila, Norman A. Sanford
Proceedings Title
Microscopy and Microanalysis
Conference Dates
August 2-6, 2020
Conference Location
Milwaukee, WI
Conference Title
Microscopy and Microanalysis 2020
Pub Type
Conferences

Download Paper

DOI Link

Keywords

atom probe, silica, algorithm
Materials characterization

Citation

Caplins, B. , Blanchard, P. , Chiaramonti, A. , Diercks, D. , Miaja, L. and Sanford, N. (2020), Correcting Systematic Energy Deficits in the Laser-Pulsed Atom Probe Mass Spectrum of SiO2, Microscopy and Microanalysis, Milwaukee, WI, [online], https://doi.org/10.1017/S1431927620023089 (Accessed October 20, 2025)

Issues

If you have any questions about this publication or are having problems accessing it, please contact [email protected].

Created July 29, 2020, Updated September 8, 2020
Was this page helpful?