Miaja, L.
, Caplins, B.
, Debay, A.
, Blanchard, P.
, Brubaker, M.
, Davydov, A.
, Diercks, D.
, Gorman, B.
, Rishinaramangalam, A.
, Feezell, D.
, Bertness, K.
and Sanford, N.
(2021),
Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor Materials, The Journal of Physical Chemistry C, [online], https://dx.doi.org/10.1021/acs.jpcc.0c08753?ref=pdf
(Accessed April 18, 2024)
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Extreme Ultraviolet Radiation Pulsed Atom Probe Tomography of III-Nitride Semiconductor Materials
Published
Author(s)
, , , , , , David R. Diercks, Brian Gorman, Ashwin Rishinaramangalam, Daniel Feezell, ,
Citation
The Journal of Physical Chemistry C
Volume
125
Pub Type
Journals
Citation
Created February 17, 2021, Updated March 1, 2021