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Nanotechnology

Nanometrology

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Displaying 701 - 725 of 866

Nanoparticle size and shape evaluation using the TSOM optical microscopy method

June 6, 2010
Author(s)
Ravikiran Attota, Richard J. Kasica, Lei Chen, Premsagar P. Kavuri, Richard M. Silver, Andras Vladar
We present a novel optical TSOM (through-focus scanning optical microscopy - pronounced as 'tee-som') method that produces nanoscale dimensional measurement sensitivity using a conventional optical microscope. The TSOM method uses optical information from

Theoretical model of errors in micromirror-based three-dimensional particle tracking

June 1, 2010
Author(s)
Andrew J. Berglund, Matthew D. McMahon, Jabez J. McClelland, James A. Liddle
Several recently developed particle-tracking and imaging methods have achieved three-dimensional sensitivity through the introduction of angled micromirrors into the observation volume of an optical microscope. We model the imaging response of such devices

Mechanical properties of one-dimensional nanostructures

May 23, 2010
Author(s)
Gheorghe Stan, Robert F. Cook
The elastic mechanical properties of one-dimensional nanostructures are considered, with an emphasis on the use of contact-resonance atomic force microscopy methods to determine elastic moduli. Various methods used to determine elastic moduli of one

Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy

May 1, 2010
Author(s)
L C. Teague, Oana Jurchescu, Curt A. Richter, Sanker Subramanian, John E. Anthony, Thomas Jackson, David J. Gundlach, James Kushmerick
We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of contact

Probing the Nanoscale

April 23, 2010
Author(s)
Robert F. Cook
Nanoscale probes can now measure all manner of nanomechanical properties, opening up opportunities for new science and new devices.

The Limits and Extensibility of Optical Patterned Defect Inspection

April 1, 2010
Author(s)
Richard M. Silver, Bryan M. Barnes, Martin Y. Sohn, Richard Quintanilha, Hui Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this approach

Calibration of 1 nm SiC Step Height Standards

March 31, 2010
Author(s)
Theodore V. Vorburger, Albert M. Hilton, Ronald G. Dixson, Ndubuisi G. Orji, J. A. Powell, A. J. Trunek, P. G. Neudeck, P. B. Abel
We aim to develop and calibrate a set of step height standards to meet the range of steps useful for nanotechnology. Of particular interest to this community is the calibration of atomic force microscopes operating at their highest levels of magnification

Proximity-associated errors in contour metrology

March 31, 2010
Author(s)
John S. Villarrubia, Ronald G. Dixson, Andras Vladar
In contour metrology the CD-SEM (critical dimension scanning electron microscope) assigns a continuous boundary to extended features in an image. The boundary is typically assigned as a simple function of the signal intensity, for example by a brightness

Characterization of Soluble Anthradithiophene Derivatives

March 18, 2010
Author(s)
Brad Conrad, Calvin Chan, Marsha A. Loth, John E. Anthony, David J. Gundlach
We will discuss the growth and electrical measurements of a newly developed, partially fluorinated anthradithiophene (F-ADT) derivative with tert-butyldiphenylsilyl (TBDMS) side groups. Single crystals of the material can be readily grown and device hole

Flip Chip Lamination Approach to Fabricate Top Metal Contacts on Organic-based Devices

March 15, 2010
Author(s)
Mariona Coll Bau, Oana Jurchescu, Nadine Gergel-Hackett, Curt Richter, Christina Hacker
Flip Chip Lamination approach to fabricate top metal contacts on organic-based devices ; M.Coll, O.D. Jurchescu, N. Gergel-Hackett, C.A. Richter, C,A, Hacker, American Physical Society (APS), March 2010, Portland, OR, USA (oral)

Nanomechanical Measurements and Tools

February 23, 2010
Author(s)
Robert F. Cook
Nanotechnology provides great opportunities for the development of advanced devices with enormous quality-of-life and economic benefits, with applications ranging from biomedical implantable actuators to environmental toxin detectors to infrastructural
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