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Nanotechnology

Nanometrology

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Displaying 676 - 700 of 857

Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion

August 11, 2010
Author(s)
Samuel M. Stavis, Jon C. Geist, Michael Gaitan
A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitations to

Carbon nanotube applications to scanning probe microscopy for next generation semiconductor metrology

August 3, 2010
Author(s)
Victor H. Vartanian, Paul McClure, Vladimir Mancevski, Joseph Kopanski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin, Vincent LaBella, Kathleen Dunn
This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication were

Purification Chemical Structure Electrical Property Relationship in Gold Nanoparticle Liquids

August 1, 2010
Author(s)
Robert I. MacCuspie, Andrea M. Elsen, Steve J. Diamanti, Steve T. Patton, Igor Altfeder, J. D. Jacobs, Andrey A. Voevodin, Richard A. Vaia
Macroscopic assemblies of nanoparticles are a new class of materials that exhibit unique properties compared to both bulk and isolated nanoparticle states. To more accurately probe the structure-property relationships of these materials, this report

Statistics of Camera-Based Single-Particle Tracking

July 22, 2010
Author(s)
Andrew J. Berglund
Through analysis of digital images, camera-based single-particle tracking enables quantitative determination of transport properties of nanoparticles and molecules and provides nanoscale information about material properties such as viscosity and

Shell and ligand-dependent blinking of CdSe-based core/shell nanocrystals

July 7, 2010
Author(s)
Bonghwan Chon, Sung Jun Lim, Wonjung Kim, Hyeong G. Kang, Taiha Joo, Jeeseong C. Hwang, Seung Koo Shin
Blinking of zinc blende CdSe-based core/shell nanocrystals is studied as a function of shell materials and surface ligands. CdSe/ZnS, CdSe/ZnSe/ZnS and CdSe/CdS/ZnS core/shell nanocrystals are prepared by colloidal synthesis and six monolayers of larger

Switching in Flexible Titanium Oxide Memristors

June 25, 2010
Author(s)
Joseph L. Tedesco, Nadine E. Gergel-Hackett, Laurie A. Stephey, Christina A. Hacker, Curt A. Richter
In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of

Application of Microwave Scanning Probes to Photovoltaic Materials

June 20, 2010
Author(s)
Kristine A. Bertness, John B. Schlager, Norman A. Sanford, Atif A. Imtiaz, Thomas M. Wallis, Joel C. Weber, Pavel Kabos, Lorelle M. Mansfield
We demonstrate that near field scanning microwave microscopy (NSMM) can be used to detect photoresponse in photovoltaic materials with potential for submicrometer resolution. In this approach, a radio-frequency scanning tunneling microscopy (RF-STM) tip is

Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis

June 20, 2010
Author(s)
Elisabeth Mansfield, Aparna Kar, Stephanie A. Hooker
A new method for analyzing the chemical purity and consistency of microscale samples is described using a quartz crystal microbalance (QCM) sensor platform. The QCM is used to monitor sub-picogram changes in the mass of a deposited thin film as a function

High frequency characterization of a Schottky contact to a GaN nanowire bundle

June 16, 2010
Author(s)
Chin J. Chiang, Thomas M. Wallis, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Paul T. Blanchard, Kristine A. Bertness, Norman A. Sanford, Kichul Kim, Dejan Filipovic
A GaN nanowire (NW) Schottky contact was characterized up to 10 GHz. Using a calibration procedure and circuit model a capacitance-voltage (CV) curve was obtained, from which a carrier concentration was calculated for the first time. These results

Nanomechanical standards based on the intrinsic mechanics of molecules and atoms

June 7, 2010
Author(s)
Jon R. Pratt, Gordon A. Shaw, Douglas T. Smith
For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individual

Nanoparticle size and shape evaluation using the TSOM optical microscopy method

June 6, 2010
Author(s)
Ravikiran Attota, Richard J. Kasica, Lei Chen, Premsagar P. Kavuri, Richard M. Silver, Andras Vladar
We present a novel optical TSOM (through-focus scanning optical microscopy - pronounced as 'tee-som') method that produces nanoscale dimensional measurement sensitivity using a conventional optical microscope. The TSOM method uses optical information from

Theoretical model of errors in micromirror-based three-dimensional particle tracking

June 1, 2010
Author(s)
Andrew J. Berglund, Matthew D. McMahon, Jabez J. McClelland, James A. Liddle
Several recently developed particle-tracking and imaging methods have achieved three-dimensional sensitivity through the introduction of angled micromirrors into the observation volume of an optical microscope. We model the imaging response of such devices

Mechanical properties of one-dimensional nanostructures

May 23, 2010
Author(s)
Gheorghe Stan, Robert F. Cook
The elastic mechanical properties of one-dimensional nanostructures are considered, with an emphasis on the use of contact-resonance atomic force microscopy methods to determine elastic moduli. Various methods used to determine elastic moduli of one

Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy

May 1, 2010
Author(s)
L C. Teague, Oana Jurchescu, Curt A. Richter, Sanker Subramanian, John E. Anthony, Thomas Jackson, David J. Gundlach, James Kushmerick
We report scanning Kelvin probe microscopy SKPM of single crystal difluoro bistriethylsilylethynyl anthradithiophene diF-TESADT organic transistors. SKPM provides a direct measurement of the intrinsic charge transport in the crystals independent of contact
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