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Nanotechnology

Nanometrology

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Displaying 676 - 700 of 866

Atomistic Factors Governing Adhesion between Diamond, Amorphous Carbon, and Model Diamond Nanocomposite Surfaces

October 1, 2010
Author(s)
Pamela L. Piotrowski, Rachel J. Cannara, Guangtu Gao, Joseph J. Urban, Robert W. Carpick, Judith A. Harrison
Complementary atomic force microscopy (AFM) and molecular dynamics (MD) simulations were conducted to determine the work of adhesion for diamond(111)(1x1) and diamond(001)(2x1) surfaces paired with other carbon-based materials. In the AFM experiments, the

Characterization of a Soluble Anthradithiophene Derivative

October 1, 2010
Author(s)
Brad Conrad, Calvin Chan, Marsha A. Loth, Sean R. Parkin, Xinran Zhang, John E. Anthony, David J. Gundlach
The structural and electrical properties of a new solution processable material, 2,8-diflouro-5,11-tert-butyldimethylsilylethynl anthradithiophene (TBDMS), were measured for single crystal and spun cast thin-film transistors. TBDMS is observed to readily

Nano- and Atom-scale Length Metrology

October 1, 2010
Author(s)
Theodore V. Vorburger, Ronald G. Dixson, Ndubuisi G. Orji, Joseph Fu, Richard A. Allen, Michael W. Cresswell, Vincent A. Hackley
Measurements of length at the nano-scale have increasing importance in manufacturing, especially in the electronics and biomedical industries. The properties of linewidth and step height are critical to the function and specification of semiconductor

Advances in Modeling of Scanning Charged-Particle-Microscopy Images

September 19, 2010
Author(s)
Petr Cizmar, Andras Vladar, Michael T. Postek
Modeling scanning electron microscope (SEM) and scanning ion microscope images has recently become necessary, because of its ability to provide repeatable images with a priori determined parameters. Modeled artificial images have been used in evaluation of

Carbon Nanotubes: Measuring Dispersion and Length

August 26, 2010
Author(s)
Jeffrey A. Fagan, Barry J. Bauer, Erik K. Hobbie, Matthew Becker, Angela R. Hight Walker, Jeffrey R. Simpson, Jae H. Chun, Jan Obrzut, Vardhan Bajpai, Frederick R. Phelan Jr., Daneesh O. Simien, JiYeon Huh, Kalman D. Migler
Advanced technological uses of single-wall carbon nanotubes (SWCNTs) rely on the production of single length and chirality populations that are currently only available through liquid phase post processing. The foundation of all of these processing steps

Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion

August 11, 2010
Author(s)
Samuel M. Stavis, Jon C. Geist, Michael Gaitan
A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitations to

Carbon nanotube applications to scanning probe microscopy for next generation semiconductor metrology

August 3, 2010
Author(s)
Victor H. Vartanian, Paul McClure, Vladimir Mancevski, Joseph J. Kopanski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin, Vincent LaBella, Kathleen Dunn
This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication were

Purification Chemical Structure Electrical Property Relationship in Gold Nanoparticle Liquids

August 1, 2010
Author(s)
Robert I. MacCuspie, Andrea M. Elsen, Steve J. Diamanti, Steve T. Patton, Igor Altfeder, J. D. Jacobs, Andrey A. Voevodin, Richard A. Vaia
Macroscopic assemblies of nanoparticles are a new class of materials that exhibit unique properties compared to both bulk and isolated nanoparticle states. To more accurately probe the structure-property relationships of these materials, this report

Statistics of Camera-Based Single-Particle Tracking

July 22, 2010
Author(s)
Andrew J. Berglund
Through analysis of digital images, camera-based single-particle tracking enables quantitative determination of transport properties of nanoparticles and molecules and provides nanoscale information about material properties such as viscosity and

Shell and ligand-dependent blinking of CdSe-based core/shell nanocrystals

July 7, 2010
Author(s)
Bonghwan Chon, Sung Jun Lim, Wonjung Kim, Hyeong G. Kang, Taiha Joo, Jeeseong C. Hwang, Seung Koo Shin
Blinking of zinc blende CdSe-based core/shell nanocrystals is studied as a function of shell materials and surface ligands. CdSe/ZnS, CdSe/ZnSe/ZnS and CdSe/CdS/ZnS core/shell nanocrystals are prepared by colloidal synthesis and six monolayers of larger

Switching in Flexible Titanium Oxide Memristors

June 25, 2010
Author(s)
Joseph L. Tedesco, Nadine E. Gergel-Hackett, Laurie A. Stephey, Christina A. Hacker, Curt A. Richter
In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of

Application of Microwave Scanning Probes to Photovoltaic Materials

June 20, 2010
Author(s)
Kristine A. Bertness, John B. Schlager, Norman A. Sanford, Atif A. Imtiaz, Thomas M. Wallis, Joel C. Weber, Pavel Kabos, Lorelle M. Mansfield
We demonstrate that near field scanning microwave microscopy (NSMM) can be used to detect photoresponse in photovoltaic materials with potential for submicrometer resolution. In this approach, a radio-frequency scanning tunneling microscopy (RF-STM) tip is

Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis

June 20, 2010
Author(s)
Elisabeth Mansfield, Aparna Kar, Stephanie A. Hooker
A new method for analyzing the chemical purity and consistency of microscale samples is described using a quartz crystal microbalance (QCM) sensor platform. The QCM is used to monitor sub-picogram changes in the mass of a deposited thin film as a function

High frequency characterization of a Schottky contact to a GaN nanowire bundle

June 16, 2010
Author(s)
Chin J. Chiang, Thomas M. Wallis, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Paul T. Blanchard, Kristine A. Bertness, Norman A. Sanford, Kichul Kim, Dejan Filipovic
A GaN nanowire (NW) Schottky contact was characterized up to 10 GHz. Using a calibration procedure and circuit model a capacitance-voltage (CV) curve was obtained, from which a carrier concentration was calculated for the first time. These results

Nanomechanical standards based on the intrinsic mechanics of molecules and atoms

June 7, 2010
Author(s)
Jon R. Pratt, Gordon A. Shaw, Douglas T. Smith
For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individual
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