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Nanotechnology

Nanometrology

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Displaying 651 - 675 of 866

Challenges for Physical Characterization of Silver Nanoparticles Under Pristine and Environmentally Relevant Conditions

March 17, 2011
Author(s)
Robert I. MacCuspie, Kim Rogers, Manomita Patra, Zhiyong Suo, Andrew J. Allen, Matthew N. Martin, Vincent A. Hackley
The conditions used to disperse silver nanoparticles (AgNPs) strongly impact their resulting size measurements and agglomeration state, based on the underlying metrology and physical chemistry, respectively. A series of AgNP materials with reported

Quantitative Subsurface Contact Resonance Force Microscopy of Model Polymer Nanocomposites

March 16, 2011
Author(s)
Jason P. Killgore, Jennifer Y. Kelly, Christopher M. Stafford, Michael J. Fasolka, Donna C. Hurley
We present experimental results on the use of quantitative contact resonance force microscopy (CR-FM) for mapping the planar location and depth of 50 nm silica nanoparticles buried beneath polystyrene films 30 nm to 165 nm thick. The presence of shallowly

An interferometric platform for studying AFM probe deflection

January 3, 2011
Author(s)
Jon R. Pratt, Lee Kumanchik, Tony L. Schmitz
This paper describes an interferometric platform for measuring the full-field deflection of atomic force microscope (AFM) probes and generic cantilevers during quasi-static loading. The platform consists of a scanning white light interferometer (SWLI)

A 10 mK Scanning Probe Microscopy Facility

December 29, 2010
Author(s)
Young J. Song, Alexander F. Otte, Steven R. Blankenship, Alan H. Band, Frank M. Hess, Young Kuk, Vladimir Shvarts, Zuyu Zhao, Joseph A. Stroscio
We describe the design, development and performance of a scanning probe microscopy (SPM) facility operating at a base temperature of 10 mK in magnetic fields up to 15 T. The microscope is cooled by a custom designed, fully ultra-high vacuum (UHV)

Characterizing a Scatterfield Optical Platform for Semiconductor Metrology

December 21, 2010
Author(s)
Bryan M. Barnes, Ravikiran Attota, Richard Quintanilha, Martin Y. Sohn, Richard M. Silver
Scatterfield microscopy is the union of a high-magnification imaging platform and the angular and/or wavelength control of scatterometry at the sample surface. Scatterfield microscopy uses Köhler illumination, where each point on the source translates to a

Scanning Probe Microscope Dimensional Metrology at NIST

December 21, 2010
Author(s)
John A. Kramar, Ronald G. Dixson, Ndubuisi G. Orji
Scanning probe microscopy (SPM) dimensional metrology efforts at the U.S. National Institute of Standards and Technology are reviewed. The main SPM instruments for realizing the International System of Units (SI) are the Molecular Measuring Machine, the

Structural Analysis of Soft Multicomponent Nanoparticle Clusters Using Electrospray Differential Mobility Analysis with Transmission Electron Microscopy

October 22, 2010
Author(s)
Leonard F. Pease , Jeremy Feldblyum, Silvia H. DePaoli Lacaerda, Rajesekhar Anumolu, Peter Yim, Matthew L. Clarke, Hyeong G. Kang, Jeeseong C. Hwang
Rapid and quantitative techniques are essential to analyze soft multicomponent nanoparticle clusters. Here we combine electrospray differential mobility analysis (ES-DMA), which measures the size of the entire cluster, with transmission electron microscopy

A Focused Chromium Ion Beam

October 21, 2010
Author(s)
Adam V. Steele, Brenton J. Knuffman, Jabez J. McClelland, Jon Orloff
With the goal of expanding the capabilities of focused ion beam microscopy and milling systems, we have demonstrated nanoscale focusing of chromium ions produced in a magneto-optical trap ion source (MOTIS). Neutral chromium atoms are captured into a

Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals

October 7, 2010
Author(s)
Hua Xu, Lei Chen, Liangbing Hu, Nikolai B. Zhitenev
We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structures
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