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Nanotechnology

Nanometrology

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Displaying 626 - 650 of 866

Guided three-dimensional catalyst folding during Metal assisted Chemical Etching of Silicon

June 28, 2011
Author(s)
Konrad Rykaczewski, Owen J. Hildreth, Ching P. Wong, Andrei G. Fedorov, John H. Scott
In order to fabricate truly complex three-dimensional (3D) silicon nanostructures fabrication methods which expand beyond the concept of creation of straight 3D structures by direct extension of two dimensional (2D) patterns need to be developed. In recent

Quantitative Determination of Competitive Molecular Adsorption on Gold Nanoparticles Using Attenuated Total Reflectance-Fourier Transform Infrared Spectroscopy

June 28, 2011
Author(s)
De-Hao D. Tsai, Melissa Davila-Morris, Frank W. DelRio, Suvajyoti S. Guha, Vincent A. Hackley, Michael R. Zachariah
Surface-sensitive quantitative studies of competitive molecular adsorption on nanoparticles were conducted using a modified Attenuated attenuated Total total Reflectionreflectance-Fourier Transform transform Infrared infrared (ATR-FTIR) spectroscopy method

Parametric study of micropillar array solar cells

June 19, 2011
Author(s)
Heayoung Yoon, Yu A. Yuwen, Haoting Shen, Nikolas J. Podraza, Thomas E. Mallouk, Elizabeth C. Dickey, Joan A. Redwing, Christopher R. Wronski, Theresa S. Mayer
Micro/nano pillar arrays can be a promising architecture for high efficiency solar cells based on less expensive photovoltaic materials with short minority carrier diffusion lengths (Ln, p). To investigate design tradeoffs of the radial junction array

Imaging of nanoscale charge transport in bulk heterojunction solar cells

June 17, 2011
Author(s)
Behrang H. Hamadani, Nadine E. Gergel-Hackett, Paul M. Haney, Nikolai B. Zhitenev
We have studied the local charge transport properties of organic bulk heterojunction solar cells based on the blends of poly(3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) with a photoconductive atomic force microscope (PCAFM). We

PDH-locked, frequency-stabilized cavity ring-down spectrometer

June 16, 2011
Author(s)
Joseph T. Hodges, A. Cygan, Piotr Maslowski, Katarzyna E. Bielska, S. Wojtewicz, J. Domyslawska, Hisashi Abe, R.S. Trawinski, R. Ciurylo
We describe a high sensitivity and high spectral resolution laser absorption spectrometer based upon the frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) technique. We used the Pound-Drever-Hall (PDH) method to lock the probe laser to the high

Hydrodynamic Fractionation of Finite Size Nano Gold Clusters

June 15, 2011
Author(s)
De-Hao D. Tsai, Tae Joon Cho, Frank W. DelRio, Julian S. Taurozzi, Michael R. Zachariah, Vincent A. Hackley
We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission scanning

Comparison of segmentation algorithms for fluorescence microscopy images of cells

June 14, 2011
Author(s)
Alden A. Dima, John T. Elliott, James J. Filliben, Michael W. Halter, Adele P. Peskin, Javier Bernal, Marcin Kociolek, Mary C. Brady, Hai C. Tang, Anne L. Plant
Segmentation results from nine different segmentation techniques applied to two different cell lines and five different sets of imaging conditions were compared. Significant variability in the results of segmentation was observed that was due solely to

CAVITY OPTOMECHANICAL SENSORS

June 5, 2011
Author(s)
Houxun H. Miao, Kartik A. Srinivasan, Matthew T. Rakher, Marcelo I. Davanco, Vladimir A. Aksyuk
We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality factor

MECHANICS OF ADHESION

June 1, 2011
Author(s)
Robert F. Cook
Abstract. A framework of increasing complexity is developed to describe the mechanics of adhesion and its reverse, de-adhesion or separation, during indentation contact cycles. The importance of the indentation probe stiffness in determination of system

Inter-ion Coulomb interactions in a Magneto-Optical Trap Ion Source

May 19, 2011
Author(s)
Jabez J. McClelland, Brenton J. Knuffman, Adam V. Steele
We have investigated the role played by inter-ion Coulomb interactions in a magneto-optical trap ion source (MOTIS). Using a Monte Carlo simulation accounting for all pair-wise ion-ion Coulomb interactions in the source, we have calculated the broadening

Progress on CD-AFM tip width calibration standards

May 10, 2011
Author(s)
Ronald G. Dixson, Boon Ping Ng, Craig D. McGray, Ndubuisi G. Orji, Jon C. Geist
The National Institute of Standards and Technology (NIST) is developing a new generation of standards for calibration of CD-AFM tip width. These standards, known as single crystal critical dimension reference materials (SCCDRM) have features with near

Flexible Memristors Fabricated through Sol-Gel Hydrolysis

May 1, 2011
Author(s)
Joseph L. Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A. Herzing, Madelaine H. Hernandez, Joseph J. Kopanski, Christina A. Hacker, Curt A. Richter
Memristors were fabricated on flexible polyethylene terephthalate substrates consisting of an oxide film generated through hydrolysis of a spun-on sol-gel. X-ray photoelectron spectroscopy, spectroscopic ellipsometry, transmission electron microscopy, and

Optical illumination optimization for patterned defect inspection

April 20, 2011
Author(s)
Bryan M. Barnes, Richard Quintanilha, Martin Y. Sohn, Hui Zhou, Richard M. Silver
Rapidly decreasing critical dimensions (CD) for semiconductor devices drive the study of improved methods for the detection of defects within patterned areas. As reduced CDs are being achieved through directional patterning, additional constraints and

TSOM Method for Semiconductor Metrology

April 18, 2011
Author(s)
Ravikiran Attota, Ronald G. Dixson, John A. Kramar, James E. Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM and

Quantification and Compensation of Unintentional Analyte Aggregation in Electrospray Sampling

March 30, 2011
Author(s)
Mingdong M. Li, Suvajyoti S. Guha, Rebecca A. Zangmeister, Michael J. Tarlov, Michael R. Zachariah
Electrospray (ES) sources are commonly used to introduce non-volatile materials (e.g. nanoparticles, proteins, etc.) in to the gas phase for characterization by mass spectrometry and ion mobility. Recent studies in our group using electrospray ion mobility

Influence of Periodic Patterning on the Magnetization Response of Micromagnetic Structures

March 29, 2011
Author(s)
SangHyun S. Lim, Thomas M. Wallis, Atif A. Imtiaz, Dazhen Gu, Thomas Cecil, Pavel Kabos, Pavol Krivoski
The magnetization dynamics of a single, patterned, thin-film Permalloy (Ni80Fe20, Py) elements embedded in a coplanar waveguide (CPW) are investigated. The anisotropic magnetoresistance (AMR) effect serves as the detection mechanism in current-modulated

Conduction and Loss Mechanisms in Flexible Oxide-Based Memristors

March 21, 2011
Author(s)
Joseph L. Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew Herzing, Madelaine H. Hernandez, Christina Hacker, Jan Obrzut, Lee Richter, Curt Richter
In order to study the conduction and loss mechanisms behind their operation, flexible sol-gel based memristors were fabricated with differing oxide film thicknesses and device sizes. XPS, TEM, EELS, and VASE measurements indicated the oxide was amorphous
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